1. 2011
  2. Scanning X-ray excited optical luminescence microscopy as a new tool for the analysis of recombination active defects in multi-crystalline silicon

    Trushin, M., Vyvenko, O., Seifert, W., Klossek, A., Zizak, I. & Kittler, M., 2011, In: Diffusion and Defect Data Pt.B: Solid State Phenomena. 178-179, p. 301-306

    Research output: Contribution to journalArticle

  3. Secondary electrons energy distribution and energy selective imaging in helium ion microscope. Advancements in Helium Ion Microscopy

    Vyvenko, O. F. & Petrov, Y. V., 2011, In: Proceedings of SPIE - The International Society for Optical Engineering. 8036, p. 80360O

    Research output: Contribution to journalArticlepeer-review

  4. 2010
  5. PHOTOLUMINESCENCE PROPERTIES OF GAAS NANOWIRE ENSEMBLES WITH ZINCBLENDE AND WURTZITE CRYSTAL STRUCTURE

    Novikov, B. V., Serov, S. Y., Filosofov, N. G., Shtrom, I. V., Talalaev, V. G., Vyvenko, O. F., Ubyivovk, E. V., Samsonenko, Y. B., Bouravleuv, A. D., Soshnikov, I. P., Sibirev, N. V., Cirlin, G. E. & Dubrovskii, V. G., 2010, In: Physica Status Solidi - Rapid Research Letetrs. 4, 7, p. 175-177 3 p.

    Research output: Contribution to journalArticle

  6. Scanning Helium Ion Microscope: Distribution of Secondary Electrons and Ion Channeling

    Petrov, Y. V., Vyvenko, O. F. & Bondarenko, A. S., 2010, In: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 4, 5, 4 p.

    Research output: Contribution to journalArticle

  7. Scanning X-ray excited optical luminescence microscopy of multi-crystalline silicon

    Vyvenko, O., Arguirov, T., Seifert, W., Zizak, I., Trushin, M. & Kittler, M., 2010, In: Physica Status Solidi (A) Applications and Materials. 207, 8, 4 p.

    Research output: Contribution to journalArticle

  8. Synthesis and structure of poly-3,4-ethylenedioxythiophene film with the inclusions of palladium nanoparticles

    Eliseeva, S. N., Ubyivovk, E. V., Bondarenko, A. S., Vyvenko, O. F. & Kondratiev, V. V., 2010, In: Russian Journal of General Chemistry. 80, 6, 6 p.

    Research output: Contribution to journalArticlepeer-review

  9. XBIC/mu-XRF/mu-XAS analysis of metals precipitation in block-cast solar silicon

    Trushin, M., Seifert, W., Vyvenko, O., Bauer, J., Martinez-Criado, G., Salome, M. & Kittler, M., 2010, XBIC/mu-XRF/mu-XAS analysis of metals precipitation in block-cast solar silicon. 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

  10. Синтез и структура пленок поли-3,4-этилендиокситиофена с включениями наночастиц палладия

    Елисеева, С. Н., Убыйвовк, Е. В., Бондаренко, А. С., Вывенко, О. Ф. & Кондратьев, В. В., 2010, In: ЖУРНАЛ ОБЩЕЙ ХИМИИ. 80, p. 973-978

    Research output: Contribution to journalArticlepeer-review

  11. 2009
  12. Dislocation luminescence and electrical properties of dislocation network produced by silicon direct wafer bonding

    Bondarenko, A., Vyvenko, O., Bazlov, N. & Kononchuk, O., 15 Dec 2009, In: Physica B: Condensed Matter. 404, 23-24, p. 4608-4611 4 p.

    Research output: Contribution to journalArticlepeer-review

  13. Synchrotron-based investigation of iron precipitation in multicrystalline silicon

    Seifert, W., Vyvenko, O., Arguirov, T., Kittler, M., Salome, M., Seibt, M. & Trushin, M., Apr 2009, In: Superlattices and Microstructures. 45, 4-5, p. 168-176 9 p.

    Research output: Contribution to journalArticlepeer-review

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