1. 2009
  2. Экспериментальное определение толщины „мертвого слоя“

    Убыйвовк, В. Е., Логинов, Д. К., Герловин, И. Я., Долгих, Ю. К., Ефимов, Ю. П., Елисеев, С. А., Петров, В. В., Вывенко, О. Ф., Ситникова, А. А. & Кириленко, Д. А., 2009, In: ФИЗИКА ТВЕРДОГО ТЕЛА. 51, 9, p. 1818-1823

    Research output: Contribution to journalArticlepeer-review

  3. 2008
  4. A pure 1.5 μm electroluminescence from metal-oxide-silicon tunneling diode using dislocation network

    Yu, X., Seifert, W., Vyvenko, O. F. & Kittler, M., 2008, In: Applied Physics Letters. 93, 4, p. 041108_1-3

    Research output: Contribution to journalArticle

  5. Detection of the border dead layer in thick quantum wells GaAs/AlGaAs

    Ubyivovk, E. V., Loginov, D. K., Gerlovin, I. Y., Dolgikh, Y. K., Efimov, Y. P., Eliseev, S. A., Petrov, V. V., Vyvenko, O. F., Sitnikova, A. A. & Kirilenko, D. A., 2008, XXII Russian Conference of the electron microscopy.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

  6. Dislocations in silicon as a tool to be used in optics, electronics and biology

    Kittler, M., Reiche, M., Arguirov, T., Mchedlidze, T., Seifert, W., Vyvenko, O. F., Wilhelm, T. & Yu, X., 2008, In: Solid State Phenomena. 131-133, p. 289-292 4 p.

    Research output: Contribution to journalConference articlepeer-review

  7. 2007
  8. Enhancement of IR emission from a dislocation network in Si due to an external bias voltage

    Yu, X., Vyvenko, O. F., Reiche, M. & Kittler, M., Sep 2007, In: Materials Science and Engineering C. 27, 5-8 SPEC. ISS., p. 1026-1029 4 p.

    Research output: Contribution to journalArticlepeer-review

  9. Silicon nanostructures for IR light emitters

    Kittler, M., Arguirov, T., Seifert, W., Yu, X., Jia, G., Vyvenko, O. F., Mchedlidze, T., Reiche, M., Sha, J. & Yang, D., Sep 2007, In: Materials Science and Engineering C. 27, 5-8 SPEC. ISS., p. 1252-1259 8 p.

    Research output: Contribution to journalArticlepeer-review

  10. Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronics

    Kittler, M., Mchedlidze, T., Arguirov, T., Vyvenko, O. F., Seifert, W., Reiche, M., Wilhelm, T. & Seibt, M., Jun 2007, In: Small. 3, 6, p. 964-973 10 p.

    Research output: Contribution to journalArticlepeer-review

  11. Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bonding

    Yu, X., Vyvenko, O., Kittler, M., Seifert, W., Mitchedlidze, T., Arguirov, T. & Reiche, M., 2007, In: Semiconductors. 41, 4, p. 458-461

    Research output: Contribution to journalArticle

ID: 218817