111 - 120 out of 184Page size: 10
  1. 2011

  2. Identification of dislocation-related luminescence participating levels in silicon by DLTS and Pulsed-CL profiling

    Bondarenko, A., Vyvenko, O. & Isakov, I., 2011, In: Journal of Physics: Conference Series. 281, 1, p. 012008

    Research output: Contribution to journal › Article › peer-review

  3. Mechanisms of dislocation network formation in Si(001) hydrophilic bonded wafers

    Vdovin, V., Vyvenko, O., Ubyivovk, E. & Kononchuk, O., 2011, In: Diffusion and Defect Data Pt.B: Solid State Phenomena. 178-179, p. 253-258

    Research output: Contribution to journal › Article

  4. Scanning X-ray excited optical luminescence microscopy as a new tool for the analysis of recombination active defects in multi-crystalline silicon

    Trushin, M., Vyvenko, O., Seifert, W., Klossek, A., Zizak, I. & Kittler, M., 2011, In: Diffusion and Defect Data Pt.B: Solid State Phenomena. 178-179, p. 301-306

    Research output: Contribution to journal › Article

  5. Secondary electrons energy distribution and energy selective imaging in helium ion microscope. Advancements in Helium Ion Microscopy

    Vyvenko, O. F. & Petrov, Y. V., 2011, In: Proceedings of SPIE - The International Society for Optical Engineering. 8036, p. 80360O

    Research output: Contribution to journal › Article › peer-review

  6. 2010

  7. PHOTOLUMINESCENCE PROPERTIES OF GAAS NANOWIRE ENSEMBLES WITH ZINCBLENDE AND WURTZITE CRYSTAL STRUCTURE

    Novikov, B. V., Serov, S. Y., Filosofov, N. G., Shtrom, I. V., Talalaev, V. G., Vyvenko, O. F., Ubyivovk, E. V., Samsonenko, Y. B., Bouravleuv, A. D., Soshnikov, I. P., Sibirev, N. V., Cirlin, G. E. & Dubrovskii, V. G., 2010, In: Physica Status Solidi - Rapid Research Letetrs. 4, 7, p. 175-177 3 p.

    Research output: Contribution to journal › Article

  8. Scanning Helium Ion Microscope: Distribution of Secondary Electrons and Ion Channeling

    Petrov, Y. V., Vyvenko, O. F. & Bondarenko, A. S., 2010, In: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 4, 5, 4 p.

    Research output: Contribution to journal › Article

  9. Scanning X-ray excited optical luminescence microscopy of multi-crystalline silicon

    Vyvenko, O., Arguirov, T., Seifert, W., Zizak, I., Trushin, M. & Kittler, M., 2010, In: Physica Status Solidi (A) Applications and Materials. 207, 8, 4 p.

    Research output: Contribution to journal › Article

  10. Synthesis and structure of poly-3,4-ethylenedioxythiophene film with the inclusions of palladium nanoparticles

    Eliseeva, S. N., Ubyivovk, E. V., Bondarenko, A. S., Vyvenko, O. F. & Kondratiev, V. V., 2010, In: Russian Journal of General Chemistry. 80, 6, 6 p.

    Research output: Contribution to journal › Article › peer-review

  11. XBIC/mu-XRF/mu-XAS analysis of metals precipitation in block-cast solar silicon

    Trushin, M., Seifert, W., Vyvenko, O., Bauer, J., Martinez-Criado, G., Salome, M. & Kittler, M., 2010, XBIC/mu-XRF/mu-XAS analysis of metals precipitation in block-cast solar silicon. 5 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  12. Синтез и структура пленок поли-3,4-этилендиокситиофена с включениями наночастиц палладия

    Елисеева, С. Н., Убыйвовк, Е. В., Бондаренко, А. С., Вывенко, О. Ф. & Кондратьев, В. В., 2010, In: ЖУРНАЛ ОБЩЕЙ ХИМИИ. 80, p. 973-978

    Research output: Contribution to journal › Article › peer-review

Previous 1...8 9 10 11 12 13 14 15 ...19 Next

ID: 218817