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  1. 2016

  2. Plasmon-enhanced Electron Scattering in Nanostructured Thin Metal Films Revealed by Low-voltage Scanning Electron Microscopy

    Mikhailovskii, V., Petrov, Y. & Vyvenko, O., 2016, In: AIP Conference Proceedings. 1748, 1, 5 p.

    Research output: Contribution to journal › Conference article

  3. Raman spectroscopy of monoatomic hydrogen at dislocations in silicon

    Vysotskii, N., Loshachenko, A., Borisov, E. & Vyvenko, O., 2016, In: Journal of Physics: Conference Series. 690, 1, p. 012004

    Research output: Contribution to journal › Article › peer-review

  4. Recombination-Related Properties of a-Screw Dislocations in GaN: A Combined CL, EBIC, TEM Study

    Medvedev, O. S., Vyvenko, O. F., Bondarenko, A. S., Mikhailovskii, V. Y., Ubyivovk, E. V., Peretzki, P. & Seibt, M., 2016, In: AIP Conference Proceedings. 1748, 1, 7 p., 020011.

    Research output: Contribution to journal › Conference article › peer-review

  5. Secondary Electron Generation in the Helium Ion Microscope: Basics and Imaging

    Petrov, Y. V. & Vyvenko, O. F., 2016, Helium Ion Microscopy. Hlawacek, G. & Gölzhäuser, A. (eds.). Springer Nature, p. 119-146 ( NanoScience and Technology).

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

  6. Structural and Electrical Properties of AlN Layers Grown on Silicon by Reactive RF Magnetron Sputtering

    Bazlov, N., Pilipenko, N., Vyvenko, O., Kotina, I., Petrov, Y., Mikhailovskii, V., Ubyivovk, E. & Zharinov, V., 2016, Structural and Electrical Properties of AlN Layers Grown on Silicon by Reactive RF Magnetron Sputtering. American Institute of Physics, 9 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  7. 2015

  8. SHOCK-INDUCED STRUCTURES IN COPPER

    Meshcheryakov, Y. I., Zhigacheva, N. I., Divakov, A. K., Konovalov, G. V., Barakhtin, B. K., Rasorenov, S. V., Vyvenko, O. V., Bondarenko, A. S. & Khomskaya, I. V., 3 Nov 2015, In: Materials Physics and Mechanics. 24, 4, p. 347-358 12 p.

    Research output: Contribution to journal › Article › peer-review

  9. Oxygen-related defects: Minority carrier lifetime killers in n-type Czochralski silicon wafers for solar cell application

    Kolevatov, I., Osinniy, V., Herms, M., Loshachenko, A., Shlyakhov, I., Kveder, V. & Vyvenko, O., 1 Aug 2015, In: Physica Status Solidi (C) Current Topics in Solid State Physics. 12, 8, p. 1108-1110 3 p.

    Research output: Contribution to journal › Article › peer-review

  10. Effect of helium ion beam treatment on the etching rate of silicon nitride

    Petrov, Y. V., Sharov, T. V., Baraban, A. P. & Vyvenko, O. F., 2015, In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. 349, p. 90-95

    Research output: Contribution to journal › Article

  11. Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy

    Mikhailovskii, V. Y., Petrov, Y. V. & Vyvenko, O. F., 2015, In: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 9, 1, p. 196-202

    Research output: Contribution to journal › Article

  12. On the luminescence of freshly introduced a-screw dislocations in low-resistance GaN

    Medvedev, O. S., Vyvenko, O. F. & Bondarenko, A. S., 2015, In: Semiconductors. 49, 9, p. 1181-1186

    Research output: Contribution to journal › Article

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