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Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon
Research output
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Contribution to journal
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Article
Department of Solid State Electronics
Overview
Cite this
DOI
https://doi.org/10.1002/pssc.200881430
Other version
M. Trushin
O. Vyvenko
W. Seifert
M. Kittler
I. Zizak
A. Erko
M. Seibt
C. Rudolf
Original language
English
Pages (from-to)
1868-1873
Journal
Physica Status Solidi (C) Current Topics in Solid State Physics
Volume
6
Issue number
8
DOIs
https://doi.org/10.1002/pssc.200881430
State
Published -
2009
ID: 5476900