Identification of dislocation-related luminescence participating levels in silicon by DLTS and Pulsed-CL profiling

Research output: Contribution to journal › Article › peer-review

Original language	Undefined
Pages (from-to)	012008
Journal	Journal of Physics: Conference Series
Volume	281
Issue number	1
DOIs	https://doi.org/DOI: 10.1088/1742-6596/281/1/012008
State	Published - 2011

ID: 5297829