Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	196-202
Journal	Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques
Volume	9
Issue number	1
DOIs	https://doi.org/10.1134/S1027451014060378
State	Published - 2015

ID: 3927572