1. 2014
  2. 2013
  3. Effect of thermal annealing and Al2O3-interlayer on intermixing in the TiN/SiO2/Si structure

    Konyushenko, M. A., Konashuk, A. S., Sokolov, A. A., Schaefers, F. & Filatova, E. O., 17 Dec 2013, In: Journal of Electron Spectroscopy and Related Phenomena. 196, p. 117-120

    Research output: Contribution to journalArticlepeer-review

  4. Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy

    Konashuk, A. S., Sokolov, A. A., Drozd, V. E., Schaefers, F. & Filatova, E. O., 2013, In: Thin Solid Films. 534, p. 363-366

    Research output: Contribution to journalArticle

  5. X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures

    Filatova, E. O., Kozhevnikov, I. V., Sokolov, A. A., Yegorova, Y. V., Konashuk, A. S., Vilkov, O. Y., Schaefers, F., Gorgoi, M. & Shulakov, A. S., 2013, In: Microelectronic Engineering. 109, p. 13-16

    Research output: Contribution to journalArticle

  6. X-ray spectroscopic study of SrTiOx films with different interlayers

    Filatova, E. O., Sokolov, A. A., Egorova, Y. V., Konashuk, A. S., Vilkov, O. Y., Gorgoi, M. & Pavlychev, A. A., 2013, In: Journal of Applied Physics. 113, 22, p. 224301_1-8

    Research output: Contribution to journalArticle

  7. 2012
  8. The influence of porous silica substrate on the properties of alumina films studied by X-ray reflection spectroscopy

    Konashuk, A. S., Sokolov, A. A., Drozd, V. E., Romanov, A. A. & Filatova, E. O., 1 Jun 2012, In: Technical Physics Letters. 38, 6, p. 562-564 3 p.

    Research output: Contribution to journalArticlepeer-review

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