X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures › SPbU Researchers Portal

X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures

Research output: Contribution to journal › Article

Department of Solid State Electronics

Links

http://dx.doi.org/10.1016/j.mee.2013.03.095

DOI

https://doi.org/10.1016/j.mee.2013.03.095
Other version

E.O. Filatova
I.V. Kozhevnikov
A.A. Sokolov
Y.V. Yegorova
A.S. Konashuk
O.Y. Vilkov
F. Schaefers
M. Gorgoi
A.S. Shulakov

Original language	English
Pages (from-to)	13-16
Journal	Microelectronic Engineering
Volume	109
DOIs	https://doi.org/10.1016/j.mee.2013.03.095
State	Published - 2013

ID: 7370680