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  1. 2012

  2. The influence of porous silica substrate on the properties of alumina films studied by X-ray reflection spectroscopy

    Konashuk, A. S., Sokolov, A. A., Drozd, V. E., Romanov, A. A. & Filatova, E. O., 1 Jun 2012, In: Technical Physics Letters. 38, 6, p. 562-564 3 p.

    Research output: Contribution to journal › Article › peer-review

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ID: 196361