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  1. 2014

  2. Memristive switching mechanism for TiO2/ITO/Al assembly: formation of molecular oxygen in TiO2

    Filatova, E., Konashuk, A., Sokolov, A., Schaefers, F. & Konyushenko, M., 2014, In: Scientific Reports. находится на повторном рецензировании

    Research output: Contribution to journal › Article › peer-review

  3. Metal/IL/TiO2/metal nanostructures as the most promising switching materials in RRAM memory Устный доклад- Филатова Е.О.

    Baraban, A. P., Selivanov, A. A., Konashuk, A. S., Drozd, V. E. & Filatova, E. O., 2014, p. 40.

    Research output: Contribution to conference › Abstract

  4. Transparent-conductive-oxide (TCO) buffer layer effect on the resistive switching process in metal/TiO2/TCO/metal assemblies

    Filatova, E. O., Baraban, A. P., Konashuk, A. S., Konyushenko, M. A., Selivanov, A. A., Sokolov, A. A., Schaefers, F. & Drozd, V. E., 2014, In: New Journal of Physics. 16, p. 113014_1-15

    Research output: Contribution to journal › Article

  5. X-ray spectroscopic study of influence of initial growth conditions on self-organization of thin oxide layers - устный доклад

    Filatova, E. O., Konyushenko, M. A., Konashuk, A. S., Sokolov, A. A. & Drozd, V. E., 2014.

    Research output: Contribution to conference › Abstract

  6. Мемристор на основе двухслойной структуры с оксидом титана

    Барабан, А. П., Дрозд, В. Е., Конашук, А. С., Селиванов, А. А. & Филатова, Е. О., 2014, p. 153-156.

    Research output: Contribution to conference › Abstract

  7. 2013

  8. Effect of thermal annealing and Al2O3-interlayer on intermixing in the TiN/SiO2/Si structure

    Konyushenko, M. A., Konashuk, A. S., Sokolov, A. A., Schaefers, F. & Filatova, E. O., 17 Dec 2013, In: Journal of Electron Spectroscopy and Related Phenomena. 196, p. 117-120

    Research output: Contribution to journal › Article › peer-review

  9. Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy

    Konashuk, A. S., Sokolov, A. A., Drozd, V. E., Schaefers, F. & Filatova, E. O., 2013, In: Thin Solid Films. 534, p. 363-366

    Research output: Contribution to journal › Article

  10. X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures

    Filatova, E. O., Kozhevnikov, I. V., Sokolov, A. A., Yegorova, Y. V., Konashuk, A. S., Vilkov, O. Y., Schaefers, F., Gorgoi, M. & Shulakov, A. S., 2013, In: Microelectronic Engineering. 109, p. 13-16

    Research output: Contribution to journal › Article

  11. X-ray spectroscopic study of SrTiOx films with different interlayers

    Filatova, E. O., Sokolov, A. A., Egorova, Y. V., Konashuk, A. S., Vilkov, O. Y., Gorgoi, M. & Pavlychev, A. A., 2013, In: Journal of Applied Physics. 113, 22, p. 224301_1-8

    Research output: Contribution to journal › Article

  12. 2012

  13. The influence of porous silica substrate on the properties of alumina films studied by X-ray reflection spectroscopy

    Konashuk, A. S., Sokolov, A. A., Drozd, V. E., Romanov, A. A. & Filatova, E. O., 1 Jun 2012, In: Technical Physics Letters. 38, 6, p. 562-564 3 p.

    Research output: Contribution to journal › Article › peer-review

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