Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Topographically-Guided van der Waals Epitaxy: Selective Growth of AlN Nanowalls on h-BN Step Edges. / Даутов, Альберт Маратович; Дубровский, Владимир Германович; Шугабаев, Талгат; Лендяшова, Вера Вадимовна; Котляр, Константин Павлович; Кузнецов, Алексей; Алексеев, Прохор; Попов, Михаил; Штром, Игорь Викторович; Toksumakov, Adilet; Ghazaryan, Davit; Парфёнова, Алеся; Арсенин, Алексей; Большаков, Алексей Дмитриевич; Цырлин, Георгий Эрнстович; Гридчин, Владислав Олегович.
в: Materials Science in Semiconductor Processing, Том 204, 110293, 15.03.2026.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Topographically-Guided van der Waals Epitaxy: Selective Growth of AlN Nanowalls on h-BN Step Edges
AU - Даутов, Альберт Маратович
AU - Дубровский, Владимир Германович
AU - Шугабаев, Талгат
AU - Лендяшова, Вера Вадимовна
AU - Котляр, Константин Павлович
AU - Кузнецов, Алексей
AU - Алексеев, Прохор
AU - Попов, Михаил
AU - Штром, Игорь Викторович
AU - Toksumakov, Adilet
AU - Ghazaryan, Davit
AU - Парфёнова, Алеся
AU - Арсенин, Алексей
AU - Большаков, Алексей Дмитриевич
AU - Цырлин, Георгий Эрнстович
AU - Гридчин, Владислав Олегович
PY - 2026/3/15
Y1 - 2026/3/15
N2 - Precise spatial and morphological control in the synthesis of semiconductor nanostructures remains a critical challenge for the bottom-up fabrication of integrated nanosystems. Here, we demonstrate that the substrate topography can be used to deterministically control the van der Waals epitaxy of AlN nanostructures on hexagonal boron nitride (h-BN) flakes. Atomic force and scanning electron microscopy studies reveal that vertical AlN nanowires grow randomly on the h-BN surface, while nanowalls preferentially nucleate and propagate along the step edges of h-BN flakes. This morphological selectivity is governed by a critical step height: nucleation of nanowalls occurs only at the steps exceeding a height of 5 ± 1 monolayers of h-BN. In the temperature range from 810 to 850 °C, increasing the growth temperature reduces the nanowire surface density and simultaneously enhances vertical growth of both nanowires and nanowalls. These trends are discussed within a qualitative model. This work establishes a new principle for topographical control over vdW epitaxy, opening a pathway for the fabrication of integrated deep-ultraviolet photonic circuits and ordered piezoelectric nanosystems.
AB - Precise spatial and morphological control in the synthesis of semiconductor nanostructures remains a critical challenge for the bottom-up fabrication of integrated nanosystems. Here, we demonstrate that the substrate topography can be used to deterministically control the van der Waals epitaxy of AlN nanostructures on hexagonal boron nitride (h-BN) flakes. Atomic force and scanning electron microscopy studies reveal that vertical AlN nanowires grow randomly on the h-BN surface, while nanowalls preferentially nucleate and propagate along the step edges of h-BN flakes. This morphological selectivity is governed by a critical step height: nucleation of nanowalls occurs only at the steps exceeding a height of 5 ± 1 monolayers of h-BN. In the temperature range from 810 to 850 °C, increasing the growth temperature reduces the nanowire surface density and simultaneously enhances vertical growth of both nanowires and nanowalls. These trends are discussed within a qualitative model. This work establishes a new principle for topographical control over vdW epitaxy, opening a pathway for the fabrication of integrated deep-ultraviolet photonic circuits and ordered piezoelectric nanosystems.
KW - AlN
KW - Nanowalls
KW - Nanowires
KW - Selective growth
KW - Two-dimensional materials
KW - h-BN
KW - van der Waals epitaxy
UR - https://www.mendeley.com/catalogue/7e388510-4b95-3540-9727-709c8526b89a/
U2 - 10.1016/j.mssp.2025.110293
DO - 10.1016/j.mssp.2025.110293
M3 - Article
VL - 204
JO - Materials Science in Semiconductor Processing
JF - Materials Science in Semiconductor Processing
SN - 1369-8001
M1 - 110293
ER -
ID: 144871955