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  1. 2021

  2. Influence of α-particles irradiation on the properties and performance of silicon semiconductor detectors

    Bakhlanov, S. V., Bazlov, N. V., Chernobrovkin, I. D., Derbin, A. V., Drachnev, I. S., Kotina, I. M., Konkov, O. I., Kuzmichev, A. M., Mikulich, M. S., Muratova, V. N., Trushin, M. V. & Unzhakov, E. V., 14 Dec 2021, In: Journal of Physics: Conference Series. 2103, 1, 012139.

    Research output: Contribution to journal › Conference article

  3. Electrically Active Defects Induced by α-Particle Irradiation in p-Type Si Surface Barrier Detector

    Bakhlanov, S., Bazlov, N., Chernobrovkin, I., Danilov, D., Derbin, A., Drachnev, I., Kotina, I., Konkov, O., Kuzmichev, A., Mikulich, M., Muratova, V., Trushin, M. & Unzhakov, E., Dec 2021, In: Physica Status Solidi (A) Applications and Materials Science. 218, 23, 5 p., 2100212.

    Research output: Contribution to journal › Article › peer-review

  4. Influence of α-particles irradiation on the performance and defect levels structure of Al/SiO2/p-type Si surface barrier detector

    Bakhlanov, S. V., Bazlov, N. V., Danilov, D. V., Derbin, A. V., Drachnev, I. S., Kotina, I. M., Konkov, O. I., Kuzmichev, A. M., Mikulich, M. S., Muratova, V. N., Trushin, M. V. & Unzhakov, E. V., 11 Jan 2021.

    Research output: Working paper › Preprint

  5. 2020

  6. Photoelectric properties of MIS structures on high-resistivity p-type silicon with aluminium nitride tunnelling insulator

    Bazlov, N. V., Danishevskii, A. M., Derbin, A. V., Drachnev, I. S., Kotina, I. M., Konkov, O. I., Kuzmichev, A. M., Lasakov, M. S., Trushin, M. V. & Unzhakov, E. V., 17 Dec 2020, In: Journal of Physics: Conference Series. 1697, 1, 012181.

    Research output: Contribution to journal › Conference article › peer-review

  7. A Change in the Parameters of Si(Li) Detectors under Exposure to α Particles

    Bazlov, N. V., Bakhlanov, S. V., Derbin, A. V., Drachnev, I. S., Izegov, G. A., Kotina, I. M., Muratova, V. N., Niyazova, N. V., Semenov, D. A., Trushin, M. V., Unzhakov, E. V. & Chmel, E. A., 1 Jan 2020, In: Instruments and Experimental Techniques. 63, 1, p. 25-29 5 p.

    Research output: Contribution to journal › Article › peer-review

  8. 2019

  9. Combined DLTS/MCTS investigations of deep electrical levels of regular dislocation networks in silicon

    Trushin, M., Varlamov, A., Loshachenko, A., Vyvenko, O. & Kittler, M., 23 May 2019, In: Journal of Physics: Conference Series. 1190, 1, 9 p., 012005.

    Research output: Contribution to journal › Conference article › peer-review

  10. Oxygen precipitate positive charge evolution upon annealing of oxygen implanted silicon

    Danilov, D., Vyvenko, O., Trushin, M., Loshachenko, A. & Sobolev, N., 23 May 2019, In: Journal of Physics: Conference Series. 1190, 1, 4 p., 012016.

    Research output: Contribution to journal › Conference article › peer-review

  11. 2014

  12. Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States

    Trushin, M. & Vyvenko, O. F., 2014, Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. p. 299-304

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  13. 2013

  14. Combined Raman-DLTS investigations of n-type Cu–In–S absorber layers grown on Cu tape substrate (CISCuT)

    Trushin, M., Arguirov, T., Kittler, M., Seifert, W., Klossek, A., Bernhard, T., Gerlach-Blumenthal, W., Hansel, A., Tober, O. & Schwabe, M., 2013, In: Physica Status Solidi (A) Applications and Materials. 210, 1, p. 222-225

    Research output: Contribution to journal › Article

  15. 2011

  16. Electrical characterization of silicon wafer bonding interfaces by means of voltage dependent light beam and electron beam induced current and capacitance of Schottky diodes

    Trushin, M., Vyvenko, O., Mchedlidze, T., Reiche, M. & Kittler, M., 2011, In: Physica Status Solidi (C) Current Topics in Solid State Physics. 8, 4, p. 1371-1376

    Research output: Contribution to journal › Article

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