1. 2001
  2. The oxide layer charging in SIMOX structures

    Askinazi, A. Y., Baraban, A. P., Dmitriev, V. A. & Miloglyadova, L. V., 1 May 2001, In: Technical Physics Letters. 27, 5, p. 422-423 2 p.

    Research output: Contribution to journalArticlepeer-review

  3. Electric field affects the charge state in ion-implanted Si-SiO2 structures

    Baraban, A. P., Miloglyadova, L. V. & Ter-Nersesyants, V. I., 1 Feb 2001, In: Technical Physics Letters. 27, 2, p. 129-131 3 p.

    Research output: Contribution to journalArticlepeer-review

  4. 2000
  5. Electroluminescence from Thin Silicon Dioxide Films

    Baraban, A. P., Semykina, E. A. & Vaniouchov, M. B., 1 Dec 2000, In: Physics of Low-Dimensional Structures. 2000, 3-4, p. 27-36 10 p.

    Research output: Contribution to journalArticlepeer-review

  6. Understanding electroluminescence from thin silicon dioxide films

    Baraban, A. P., Semykina, E. A. & Vaniouchov, M. B., 1 Jun 2000, In: Semiconductor Science and Technology. 15, 6, p. 546-550 5 p.

    Research output: Contribution to journalArticlepeer-review

  7. Effect of ultraviolet irradiation on the charge state of ion-implanted silicon-silicon dioxide structures

    Baraban, A. P. & Malyavka, L. V., 1 Jan 2000, In: Technical Physics Letters. 26, 2, p. 159-160 2 p.

    Research output: Contribution to journalArticlepeer-review

  8. Electroluminescence of ion-implanted Si-SiO2 structures

    Baraban, A. P., Konorov, P. P., Malyavka, L. V. & Troshikhin, A. G., 1 Jan 2000, In: Technical Physics. 45, 8, p. 1042-1044 3 p.

    Research output: Contribution to journalArticlepeer-review

  9. 1998
  10. Numerical simulation of electron transport in MIS-structures

    Baraban, A. P., Sazonov, S. G. & Zuluev, Z. N., 1 Dec 1998, In: Physics of Low-Dimensional Structures. 1998, 7-8, p. 35-42 8 p.

    Research output: Contribution to journalArticlepeer-review

  11. 1997
  12. Synthesis and investigation of heterooxides by ML-ALE method

    Drozd, V. E., Baraban, A. P., Nikiforova, I. O. & Aleskovski, V. B., 1 Jan 1997, In: Applied Surface Science. 112, p. 264-268 5 p.

    Research output: Contribution to journalArticlepeer-review

  13. 1996
  14. Electroluminescence analysis of the structural damage created in SiO2/Si systems by Ar ion implantation

    Bota, S., Garrido, B., Morante, J. R., Baraban, A. & Konorov, P. P., 1 Jan 1996, In: Solid-State Electronics. 39, 3, p. 355-359 5 p.

    Research output: Contribution to journalArticlepeer-review

  15. 1994
  16. Electrical properties of Si-Al2O3 structures grown by ML-ALE

    Drozd, V. E., Baraban, A. P. & Nikiforova, I. O., 2 Dec 1994, In: Applied Surface Science. 82-83, C, p. 583-586 4 p.

    Research output: Contribution to journalArticlepeer-review

ID: 147658