1. 1987
  2. UNIVERSAL CAPACITIVE SPECTROMETER FOR MEASURING THE PARAMETERS OF DEEP CENTERS IN SEMICONDUCTORS AND MOS STRUCTURES.

    Bazlov, N. V., Vyvenko, O. F. & Tul'ev, A. V., May 1987, In: Instruments and experimental techniques New York. 30, 3 pt 2, p. 696-701 6 p.

    Research output: Contribution to journalArticlepeer-review

  3. Физико-химические основы микроэлектроники конструирования и технологии РЭА и ЭВА.

    Яфясов, А. А. М., 1987, Физико-химические основы микроэлектроники конструирования и технологии РЭА и ЭВА. .

    Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

  4. 1986
  5. Manifestation of Structure and Occupation of Energy Bands in Surface Effects of Semiconductors

    Romanov, O. V. & Yafyasov, A. M., 1 Jan 1986, In: physica status solidi (a). 94, 1, p. 235-242 8 p.

    Research output: Contribution to journalArticlepeer-review

  6. DEEP LEVELS DUE TO DISLOCATIONS IN CdS.

    Vyvenko, O. F., Bazlov, N. V. & Tul'ev, A. V., 1986, In: Bulletin of the Academy of Sciences of the U.S.S.R. Physical series. 51, 4, p. 39-43 5 p.

    Research output: Contribution to journalConference articlepeer-review

  7. 1985
  8. INVERSE PHOTOEMISSION SPECTRAL INTENSITY OF RARE-EARTH METALS.

    Pavlychev, A. A., Shulakov, A. S. & Kondrat'yeva, I. V., 1 Dec 1985, In: Physics of Metals and Metallography. 60, 5, p. 62-66 5 p.

    Research output: Contribution to journalArticlepeer-review

  9. 1984
  10. INVESTIGATION OF THE SELF-DEPOSITION OF Au AND Ag ON A GERMANIUM ELECTRODE.

    Romanov, O. V. & Yafyasov, A. M., 1 Aug 1984, In: SOVIET ELECTROCHEMISTRY. 20, 8, p. 998-1001 4 p.

    Research output: Contribution to journalArticlepeer-review

  11. CHARACTERISTICS OF THE Si-SiO2 PHASE BOUNDARY AND THE SURFACE MOBILITY OF HOLES IN AN INVERSION LAYER.

    Uritskii, V. Y., Romanov, O. V. & Yafyasov, A. M., 1 Jan 1984, In: Soviet physics. Semiconductors. 18, 3, p. 247-249 3 p.

    Research output: Contribution to journalArticlepeer-review

  12. POINT-DEFECT CLOUDS AT LOW-ANGLE BOUNDARIES IN CADMIUM SULPHIDE.

    Vyvenko, O. F. & Schroeter, W., 1 Jan 1984, In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 50, 4

    Research output: Contribution to journalArticlepeer-review

  13. POTENTIODYNAMIC MEASUREMENTS OF THE MOBILITY OF FREE CHARGE CARRIERS ON A SEMICONDUCTING ELECTRODE.

    Romanov, O. V. & Yafyasov, A. M., 1 Jan 1984, In: SOVIET ELECTROCHEMISTRY. 20, 1, p. 90-93 4 p.

    Research output: Contribution to journalArticlepeer-review

  14. 1983
  15. INFLUENCE OF BAND DEGENERACY AND NONPARABOLICITY ON THE MEASUREMENTS OF SURFACE EFFECTS IN SEMICONDUCTORS.

    Kapitonov, M. V., Yafyasov, A. M. & Romanov, O. V., 1 Jan 1983, In: Soviet physics. Semiconductors. 17, 5, p. 511-514 4 p.

    Research output: Contribution to journalArticlepeer-review

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