Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
MBE Growth and Structural Properties of GaP and InP Nanowires on a SiC Substrate with a Graphene Layer. / Reznik, R. R.; Kotlyar, K. P.; Ilkiv, I. V.; Soshnikov, I. P.; Lebedev, S. P.; Lebedev, A. A.; Kirilenko, D. A.; Alexeev, P. A.; Cirlin, G. E.
в: Semiconductors, Том 52, № 11, 01.11.2018, стр. 1428-1431.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - MBE Growth and Structural Properties of GaP and InP Nanowires on a SiC Substrate with a Graphene Layer
AU - Reznik, R. R.
AU - Kotlyar, K. P.
AU - Ilkiv, I. V.
AU - Soshnikov, I. P.
AU - Lebedev, S. P.
AU - Lebedev, A. A.
AU - Kirilenko, D. A.
AU - Alexeev, P. A.
AU - Cirlin, G. E.
N1 - Publisher Copyright: © 2018, Pleiades Publishing, Ltd.
PY - 2018/11/1
Y1 - 2018/11/1
N2 - Abstract: The possibility in principle of the MBE (molecular-beam epitaxy) growth of GaP and InP nanowires on a SiC substrate with a graphene layer is demonstrated for the first time. InP nanowires on such a substrate have no stacking faults and possess an ideal crystallographic quality. At the same time, GaP nanowires have structural defects of the type of twins and the reversal of crystallographic phases at the top and at the base. The results of structural measurements demonstrate that the nanowires are formed in the wurtzite phase, which is not typical of bulk III–V materials.
AB - Abstract: The possibility in principle of the MBE (molecular-beam epitaxy) growth of GaP and InP nanowires on a SiC substrate with a graphene layer is demonstrated for the first time. InP nanowires on such a substrate have no stacking faults and possess an ideal crystallographic quality. At the same time, GaP nanowires have structural defects of the type of twins and the reversal of crystallographic phases at the top and at the base. The results of structural measurements demonstrate that the nanowires are formed in the wurtzite phase, which is not typical of bulk III–V materials.
UR - http://www.scopus.com/inward/record.url?scp=85055256575&partnerID=8YFLogxK
U2 - 10.1134/S1063782618110210
DO - 10.1134/S1063782618110210
M3 - Article
AN - SCOPUS:85055256575
VL - 52
SP - 1428
EP - 1431
JO - Semiconductors
JF - Semiconductors
SN - 1063-7826
IS - 11
ER -
ID: 98507711