121 - 130 out of 163Page size: 10
  1. 2014

  2. Transparent-conductive-oxide (TCO) buffer layer effect on the resistive switching process in metal/TiO2/TCO/metal assemblies

    Filatova, E. O., Baraban, A. P., Konashuk, A. S., Konyushenko, M. A., Selivanov, A. A., Sokolov, A. A., Schaefers, F. & Drozd, V. E., 2014, In: New Journal of Physics. 16, p. 113014_1-15

    Research output: Contribution to journal › Article

  3. X-ray spectroscopic study of influence of initial growth conditions on self-organization of thin oxide layers - устный доклад

    Filatova, E. O., Konyushenko, M. A., Konashuk, A. S., Sokolov, A. A. & Drozd, V. E., 2014.

    Research output: Contribution to conference › Abstract

  4. X-ray spectroscopy of insulator films and interfaces - устный доклад

    Filatova, E. O., 2014, p. 67-68.

    Research output: Contribution to conference › Abstract

  5. Мемристор на основе двухслойной структуры с оксидом титана

    Барабан, А. П., Дрозд, В. Е., Конашук, А. С., Селиванов, А. А. & Филатова, Е. О., 2014, p. 153-156.

    Research output: Contribution to conference › Abstract

  6. Электрофизические свойства многослойной структуры SiC−Si

    Божевольнов, В. Б., Яфясов, А. М., Миайловский, В. Ю., Егорова, Ю. В., Соколов, А. А. & Филатова, Е. О., 2014, In: ФИЗИКА И ТЕХНИКА ПОЛУПРОВОДНИКОВ. 48, 6, p. 814 - 817

    Research output: Contribution to journal › Article › peer-review

  7. 2013

  8. Effect of thermal annealing and Al2O3-interlayer on intermixing in the TiN/SiO2/Si structure

    Konyushenko, M. A., Konashuk, A. S., Sokolov, A. A., Schaefers, F. & Filatova, E. O., 17 Dec 2013, In: Journal of Electron Spectroscopy and Related Phenomena. 196, p. 117-120

    Research output: Contribution to journal › Article › peer-review

  9. “Development of a comprehensive approach to study a structure of thin-film systems”

    Филатова, Е. О., 2013, Издательский Центр «Академия».

    Research output: Book/Report/Anthology › Commissioned report

  10. Model Approach to Solving the Inverse Problem of X-Ray Reflectometry and Its Application to the Study of the Internal Structure of Hafnium Oxide Films

    Volkov, Y. O., Kozhevnikov, I. V., Roshchin, B. S., Filatova, E. O. & Asadchikov, V. E., 2013, In: Crystallography Reports. 58, 1, p. 160-167

    Research output: Contribution to journal › Article

  11. Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy

    Konashuk, A. S., Sokolov, A. A., Drozd, V. E., Schaefers, F. & Filatova, E. O., 2013, In: Thin Solid Films. 534, p. 363-366

    Research output: Contribution to journal › Article

  12. X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures

    Filatova, E. O., Kozhevnikov, I. V., Sokolov, A. A., Yegorova, Y. V., Konashuk, A. S., Vilkov, O. Y., Schaefers, F., Gorgoi, M. & Shulakov, A. S., 2013, In: Microelectronic Engineering. 109, p. 13-16

    Research output: Contribution to journal › Article

Previous 1...9 10 11 12 13 14 15 16 17 Next

ID: 173981