Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
MBE growth and Structural Properties of InAs and InGaAs Nanowires with Different Mole Fraction of In on Si and Strongly Mismatched SiC/Si(111) Substrates. / Reznik, R. R.; Kotlyar, K. P.; Soshnikov, I. P.; Kukushkin, S. A.; Osipov, A. V.; Cirlin, G. E.
в: Semiconductors, Том 52, № 5, 01.05.2018, стр. 651-653.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - MBE growth and Structural Properties of InAs and InGaAs Nanowires with Different Mole Fraction of In on Si and Strongly Mismatched SiC/Si(111) Substrates
AU - Reznik, R. R.
AU - Kotlyar, K. P.
AU - Soshnikov, I. P.
AU - Kukushkin, S. A.
AU - Osipov, A. V.
AU - Cirlin, G. E.
N1 - Publisher Copyright: © 2018, Pleiades Publishing, Ltd.
PY - 2018/5/1
Y1 - 2018/5/1
N2 - The possibility of InAs nanowires MBE growth on silicon (111) substrates with a nanometer buffer layer of silicon carbide has been demonstrated for the first time. The NWs diameter turned out to be smaller than on the silicon substrate—the minimum of NWs diameter was less than 10 nm. In addition, dependence of structural properties of InGaAs nanowires on composition was studied.
AB - The possibility of InAs nanowires MBE growth on silicon (111) substrates with a nanometer buffer layer of silicon carbide has been demonstrated for the first time. The NWs diameter turned out to be smaller than on the silicon substrate—the minimum of NWs diameter was less than 10 nm. In addition, dependence of structural properties of InGaAs nanowires on composition was studied.
UR - http://www.scopus.com/inward/record.url?scp=85045748310&partnerID=8YFLogxK
U2 - 10.1134/S1063782618050251
DO - 10.1134/S1063782618050251
M3 - Article
AN - SCOPUS:85045748310
VL - 52
SP - 651
EP - 653
JO - Semiconductors
JF - Semiconductors
SN - 1063-7826
IS - 5
ER -
ID: 98508788