DOI

  • Andrey V. Soukhorukov
  • Davud V. Guseinov
  • Alexei V. Kudrin
  • Sergey A. Popkov
  • Alexandra P. Detochenko
  • Alexandra V. Koroleva
  • Alexander A. Ezhevskii
  • Anton A. Konakov
  • Nikolai V. Abrosimov
  • Helge Riemann

Transport and spin relaxation characteristics of the conduction electrons in silicon samples doped with bismuth in the 1.1·1013 - 7.7·1015 cm-3 concentration range were studied by the Hall and electron spin resonance spectroscopy. Hall effect measurements in the temperature range 10-80 K showed a deviation from the linear dependence of the Hall resistance in the magnetic field, which is a manifestation of the anomalous Hall effect. The magnetoresistance investigation shows that with current increasing magnetoresistance may change its sign from positive to negative, which is most clearly seen when the bismuth concentration goes up to 7.7·1015 cm-3. The conduction electron spin relaxation rate dramatically increases in silicon samples with sufficiently low concentration of bismuth ~ 2·1014 cm-3. All these results can be explained in terms of the concept of spin-dependent and spin flip scattering induced by heavy bismuth impurity centers.

Язык оригиналаанглийский
Название основной публикацииGettering and Defect Engineering in Semiconductor Technology XVI
РедакторыPeter Pichler, Peter Pichler
ИздательTrans Tech Publications Ltd
Страницы327-331
Число страниц5
ISBN (печатное издание)9783038356080
DOI
СостояниеОпубликовано - 1 янв 2016
Событие16th International Conference on Gettering and Defect Engineering in Semiconductor Technology, GADEST 2015 - Bad Staffelstein, Германия
Продолжительность: 20 сен 201525 сен 2015

Серия публикаций

НазваниеSolid State Phenomena
Том242
ISSN (электронное издание)1662-9779

конференция

конференция16th International Conference on Gettering and Defect Engineering in Semiconductor Technology, GADEST 2015
Страна/TерриторияГермания
ГородBad Staffelstein
Период20/09/1525/09/15

    Предметные области Scopus

  • Атомная и молекулярная физика и оптика
  • Материаловедение (все)
  • Физика конденсатов

ID: 47708992