Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Effect of Pretreatment of the Silicon Substrate on the Properties of GaN Films Grown by Chloride–Hydride Vapor-Phase Epitaxy. / Seredin, P. V.; Barkov, K. A.; Goloshchapov, D. L.; Lenshin, A. S.; Khudyakov, Yu Yu; Arsentiev, I. N.; Lebedev, A. A.; Sharofidinov, Sh Sh; Mizerov, A. M.; Kasatkin, I. A.; Prutskij, Tatiana.
в: Semiconductors, Том 55, № 12, 12.2021, стр. 995-1001.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Effect of Pretreatment of the Silicon Substrate on the Properties of GaN Films Grown by Chloride–Hydride Vapor-Phase Epitaxy
AU - Seredin, P. V.
AU - Barkov, K. A.
AU - Goloshchapov, D. L.
AU - Lenshin, A. S.
AU - Khudyakov, Yu Yu
AU - Arsentiev, I. N.
AU - Lebedev, A. A.
AU - Sharofidinov, Sh Sh
AU - Mizerov, A. M.
AU - Kasatkin, I. A.
AU - Prutskij, Tatiana
N1 - Publisher Copyright: © 2021, Pleiades Publishing, Ltd.
PY - 2021/12
Y1 - 2021/12
N2 - Abstract: The growth of GaN films on preliminarily treated Si(001) substrates by chloride–hydride vapor-phase epitaxy through a buffer layer is reported. It is demonstrated that the use of the technology proposed in the study brings about the formation of a Si transition sublayer in the Si substrate, so that further growth on this sublayer provides the formation of columnar GaN grains, between which there is a thin interlayer of the AlN phase. The epitaxial GaN film possesses low residual stresses, which is reflected in high-intensity luminescence.
AB - Abstract: The growth of GaN films on preliminarily treated Si(001) substrates by chloride–hydride vapor-phase epitaxy through a buffer layer is reported. It is demonstrated that the use of the technology proposed in the study brings about the formation of a Si transition sublayer in the Si substrate, so that further growth on this sublayer provides the formation of columnar GaN grains, between which there is a thin interlayer of the AlN phase. The epitaxial GaN film possesses low residual stresses, which is reflected in high-intensity luminescence.
KW - AlN
KW - chloride–hydride vapor-phase epitaxy
KW - GaN
KW - photoluminescence
KW - Si
UR - http://www.scopus.com/inward/record.url?scp=85126852012&partnerID=8YFLogxK
U2 - 10.1134/S1063782621080170
DO - 10.1134/S1063782621080170
M3 - Article
AN - SCOPUS:85126852012
VL - 55
SP - 995
EP - 1001
JO - Semiconductors
JF - Semiconductors
SN - 1063-7826
IS - 12
ER -
ID: 94004757