• R. A. Senin
  • A. S. Khlebnikov
  • A. E. Vyazovetskova
  • I. A. Blinov
  • A. O. Golubitskii
  • I. V. Kazakov
  • A. A. Vorob'Ev
  • A. V. Buzmakov
  • V. E. Asadchikov
  • V. A. Shishkov
  • E. Kh Mukhamedzhanov
  • M. V. Kovalchuk

An upgraded X-ray Topography and Microtomography (XRT-MT) station is described, the parameters of the optical schemes and detectors are given, and the experimental possibilities of the station are analyzed. Examples of tomographic reconstructions are reported which demonstrate spatial resolutions of 2.5 and 10 μm at fields of view of 2.5 and 10 mm, respectively.

Original languageEnglish
Pages (from-to)517-522
Number of pages6
JournalCrystallography Reports
Volume58
Issue number3
DOIs
StatePublished - May 2013
Externally publishedYes

    Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

ID: 88210451