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Upgraded X-ray topography and microtomography beamline at the Kurchatov synchrotron radiation source. / Senin, R. A.; Khlebnikov, A. S.; Vyazovetskova, A. E.; Blinov, I. A.; Golubitskii, A. O.; Kazakov, I. V.; Vorob'Ev, A. A.; Buzmakov, A. V.; Asadchikov, V. E.; Shishkov, V. A.; Mukhamedzhanov, E. Kh; Kovalchuk, M. V.
In:
Crystallography Reports, Vol. 58, No. 3, 05.2013, p. 517-522.
Research output: Contribution to journal › Article › peer-review
Harvard
Senin, RA, Khlebnikov, AS, Vyazovetskova, AE, Blinov, IA, Golubitskii, AO, Kazakov, IV, Vorob'Ev, AA, Buzmakov, AV, Asadchikov, VE, Shishkov, VA, Mukhamedzhanov, EK
& Kovalchuk, MV 2013, '
Upgraded X-ray topography and microtomography beamline at the Kurchatov synchrotron radiation source',
Crystallography Reports, vol. 58, no. 3, pp. 517-522.
https://doi.org/10.1134/S1063774513030206APA
Senin, R. A., Khlebnikov, A. S., Vyazovetskova, A. E., Blinov, I. A., Golubitskii, A. O., Kazakov, I. V., Vorob'Ev, A. A., Buzmakov, A. V., Asadchikov, V. E., Shishkov, V. A., Mukhamedzhanov, E. K.
, & Kovalchuk, M. V. (2013).
Upgraded X-ray topography and microtomography beamline at the Kurchatov synchrotron radiation source.
Crystallography Reports,
58(3), 517-522.
https://doi.org/10.1134/S1063774513030206Vancouver
Author
Senin, R. A. ; Khlebnikov, A. S. ; Vyazovetskova, A. E. ; Blinov, I. A. ; Golubitskii, A. O. ; Kazakov, I. V. ; Vorob'Ev, A. A. ; Buzmakov, A. V. ; Asadchikov, V. E. ; Shishkov, V. A. ; Mukhamedzhanov, E. Kh
; Kovalchuk, M. V. /
Upgraded X-ray topography and microtomography beamline at the Kurchatov synchrotron radiation source. In:
Crystallography Reports. 2013 ; Vol. 58, No. 3. pp. 517-522.
BibTeX
@article{55a49c912cea4d87b6e5d49b4e0bab6c,
title = "Upgraded X-ray topography and microtomography beamline at the Kurchatov synchrotron radiation source",
abstract = "An upgraded X-ray Topography and Microtomography (XRT-MT) station is described, the parameters of the optical schemes and detectors are given, and the experimental possibilities of the station are analyzed. Examples of tomographic reconstructions are reported which demonstrate spatial resolutions of 2.5 and 10 μm at fields of view of 2.5 and 10 mm, respectively.",
author = "Senin, {R. A.} and Khlebnikov, {A. S.} and Vyazovetskova, {A. E.} and Blinov, {I. A.} and Golubitskii, {A. O.} and Kazakov, {I. V.} and Vorob'Ev, {A. A.} and Buzmakov, {A. V.} and Asadchikov, {V. E.} and Shishkov, {V. A.} and Mukhamedzhanov, {E. Kh} and Kovalchuk, {M. V.}",
year = "2013",
month = may,
doi = "10.1134/S1063774513030206",
language = "English",
volume = "58",
pages = "517--522",
journal = "Crystallography Reports",
issn = "1063-7745",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "3",
}
RIS
TY - JOUR
T1 - Upgraded X-ray topography and microtomography beamline at the Kurchatov synchrotron radiation source
AU - Senin, R. A.
AU - Khlebnikov, A. S.
AU - Vyazovetskova, A. E.
AU - Blinov, I. A.
AU - Golubitskii, A. O.
AU - Kazakov, I. V.
AU - Vorob'Ev, A. A.
AU - Buzmakov, A. V.
AU - Asadchikov, V. E.
AU - Shishkov, V. A.
AU - Mukhamedzhanov, E. Kh
AU - Kovalchuk, M. V.
PY - 2013/5
Y1 - 2013/5
N2 - An upgraded X-ray Topography and Microtomography (XRT-MT) station is described, the parameters of the optical schemes and detectors are given, and the experimental possibilities of the station are analyzed. Examples of tomographic reconstructions are reported which demonstrate spatial resolutions of 2.5 and 10 μm at fields of view of 2.5 and 10 mm, respectively.
AB - An upgraded X-ray Topography and Microtomography (XRT-MT) station is described, the parameters of the optical schemes and detectors are given, and the experimental possibilities of the station are analyzed. Examples of tomographic reconstructions are reported which demonstrate spatial resolutions of 2.5 and 10 μm at fields of view of 2.5 and 10 mm, respectively.
UR - http://www.scopus.com/inward/record.url?scp=84878237728&partnerID=8YFLogxK
U2 - 10.1134/S1063774513030206
DO - 10.1134/S1063774513030206
M3 - Article
AN - SCOPUS:84878237728
VL - 58
SP - 517
EP - 522
JO - Crystallography Reports
JF - Crystallography Reports
SN - 1063-7745
IS - 3
ER -
