Research output: Contribution to journal › Article › peer-review
Study of the Structure of Composite Materials Based on PbSb2Te4 Obtained by the Czochralski Method. / Nemov, S.A.; Andreeva, V.; Povolotskiy, A.V.; Alyab’ev, A.Y.
In: Glass Physics and Chemistry, Vol. 50, No. 5, 2024, p. 553-560.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Study of the Structure of Composite Materials Based on PbSb2Te4 Obtained by the Czochralski Method
AU - Nemov, S.A.
AU - Andreeva, V.
AU - Povolotskiy, A.V.
AU - Alyab’ev, A.Y.
N1 - Export Date: 01 November 2025; Cited By: 0; Correspondence Address: A.Y. Alyab’ev; St. Petersburg Electrotechnical University, St. Petersburg, 197022, Russian Federation; email: alyabjev_au@mail.ru
PY - 2024
Y1 - 2024
N2 - Research on PbSb2Te4 composite material samples, obtained by the Czochralski method, is continued. The multiphase structure of the material is confirmed. Based on the analysis of X-ray studies, the predominance of PbSb2Te4 (70–80%) and Sb2Te3 (20–30%) phases is found. Traces of (CuSb)Te2 phases with a rhombohedral structure and a hexagonal phase of Sb2Te2 are detected. The carrier concentration is reduced by doping the samples with copper; the impurity atoms are located in the Van der Waals gap between the layers of the main phases. With the copper content in the initial charge increasing from 0.5 to 1 at %, the carrier concentration does not decrease further. © 2025 Elsevier B.V., All rights reserved.
AB - Research on PbSb2Te4 composite material samples, obtained by the Czochralski method, is continued. The multiphase structure of the material is confirmed. Based on the analysis of X-ray studies, the predominance of PbSb2Te4 (70–80%) and Sb2Te3 (20–30%) phases is found. Traces of (CuSb)Te2 phases with a rhombohedral structure and a hexagonal phase of Sb2Te2 are detected. The carrier concentration is reduced by doping the samples with copper; the impurity atoms are located in the Van der Waals gap between the layers of the main phases. With the copper content in the initial charge increasing from 0.5 to 1 at %, the carrier concentration does not decrease further. © 2025 Elsevier B.V., All rights reserved.
KW - Czochralski method
KW - kinetic coefficients
KW - layered structure
KW - optical properties of crystals
KW - phase composition
KW - tetrademite-like chalcogenides
KW - X-ray structural analysis
KW - Crystal atomic structure
KW - Crystal impurities
KW - Crystalline materials
KW - II-VI semiconductors
KW - IV-VI semiconductors
KW - Selenium compounds
KW - Tellurium compounds
KW - Composites material
KW - Kinetic coefficient
KW - Layered Structures
KW - Material-based
KW - Optical property of crystal
KW - Optical-
KW - Property
KW - Structure of composites
KW - Tetrademite-like chalcogenide
KW - X ray structural analysis
KW - Carrier concentration
U2 - 10.1134/S1087659624600467
DO - 10.1134/S1087659624600467
M3 - Article
VL - 50
SP - 553
EP - 560
JO - Glass Physics and Chemistry
JF - Glass Physics and Chemistry
SN - 1087-6596
IS - 5
ER -
ID: 143421011