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Research on PbSb2Te4 composite material samples, obtained by the Czochralski method, is continued. The multiphase structure of the material is confirmed. Based on the analysis of X-ray studies, the predominance of PbSb2Te4 (70–80%) and Sb2Te3 (20–30%) phases is found. Traces of (CuSb)Te2 phases with a rhombohedral structure and a hexagonal phase of Sb2Te2 are detected. The carrier concentration is reduced by doping the samples with copper; the impurity atoms are located in the Van der Waals gap between the layers of the main phases. With the copper content in the initial charge increasing from 0.5 to 1 at %, the carrier concentration does not decrease further. © 2025 Elsevier B.V., All rights reserved.
Original languageEnglish
Pages (from-to)553-560
Number of pages8
JournalGlass Physics and Chemistry
Volume50
Issue number5
DOIs
StatePublished - 2024

    Research areas

  • Czochralski method, kinetic coefficients, layered structure, optical properties of crystals, phase composition, tetrademite-like chalcogenides, X-ray structural analysis, Crystal atomic structure, Crystal impurities, Crystalline materials, II-VI semiconductors, IV-VI semiconductors, Selenium compounds, Tellurium compounds, Composites material, Kinetic coefficient, Layered Structures, Material-based, Optical property of crystal, Optical-, Property, Structure of composites, Tetrademite-like chalcogenide, X ray structural analysis, Carrier concentration

ID: 143421011