Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs

Standard

Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. / Spurgeon, Steven; Matthews, Bethany; Sushko, Peter; Linpeng, Xiayu; Viitaniemi, Maria; Durnev, Mikhail; Glazov, Mikhail; Wieck, Andreas; Ludwig, Arne; Fu, Kai Mei.

In: Microscopy and Microanalysis, Vol. 26, No. Suppl 2, 2020.

Research output: Contribution to journal › Article › peer-review

Harvard

Spurgeon, S, Matthews, B, Sushko, P, Linpeng, X, Viitaniemi, M, Durnev, M, Glazov, M, Wieck, A, Ludwig, A & Fu, KM 2020, 'Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs', Microscopy and Microanalysis, vol. 26, no. Suppl 2. https://doi.org/10.1017/S1431927620022904

APA

Spurgeon, S., Matthews, B., Sushko, P., Linpeng, X., Viitaniemi, M., Durnev, M., Glazov, M., Wieck, A., Ludwig, A., & Fu, K. M. (2020). Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. Microscopy and Microanalysis, 26(Suppl 2). https://doi.org/10.1017/S1431927620022904

Vancouver

Spurgeon S, Matthews B, Sushko P, Linpeng X, Viitaniemi M, Durnev M et al. Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. Microscopy and Microanalysis. 2020;26(Suppl 2). https://doi.org/10.1017/S1431927620022904

Author

Spurgeon, Steven ; Matthews, Bethany ; Sushko, Peter ; Linpeng, Xiayu ; Viitaniemi, Maria ; Durnev, Mikhail ; Glazov, Mikhail ; Wieck, Andreas ; Ludwig, Arne ; Fu, Kai Mei. / Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. In: Microscopy and Microanalysis. 2020 ; Vol. 26, No. Suppl 2.

BibTeX

@article{e253c9ec677e4a41a42e81f10971b4cd,

title = "Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs",

author = "Steven Spurgeon and Bethany Matthews and Peter Sushko and Xiayu Linpeng and Maria Viitaniemi and Mikhail Durnev and Mikhail Glazov and Andreas Wieck and Arne Ludwig and Fu, {Kai Mei}",

year = "2020",

doi = "10.1017/S1431927620022904",

language = "English",

volume = "26",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl 2",

}

RIS

TY - JOUR

T1 - Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs

AU - Spurgeon, Steven

AU - Matthews, Bethany

AU - Sushko, Peter

AU - Linpeng, Xiayu

AU - Viitaniemi, Maria

AU - Durnev, Mikhail

AU - Glazov, Mikhail

AU - Wieck, Andreas

AU - Ludwig, Arne

AU - Fu, Kai Mei

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?scp=85094102298&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/3eb04939-503a-3d1a-ac08-01d07fbd0f49/

U2 - 10.1017/S1431927620022904

DO - 10.1017/S1431927620022904

M3 - Article

AN - SCOPUS:85094102298

VL - 26

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - Suppl 2

ER -

ID: 70500602