Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs › SPbU Researchers Portal

Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs

Research output: Contribution to journal › Article › peer-review

I.N.Uraltsev Research Laboratory of Spin Optics

DOI

https://doi.org/10.1017/S1431927620022904
Final published version

Steven Spurgeon
Bethany Matthews
Peter Sushko
Xiayu Linpeng
Maria Viitaniemi
Mikhail Durnev
Mikhail Glazov
Andreas Wieck
Arne Ludwig
Kai Mei Fu

Original language	English
Journal	Microscopy and Microanalysis
Volume	26
Issue number	Suppl 2
DOIs	https://doi.org/10.1017/S1431927620022904
State	Published - 2020

Scopus subject areas

Instrumentation

ID: 70500602