Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research
Interface method of digital devices testing. / Grishkin, V.; Yelaev, Y.; Lopatkin, G.; Mikhailov, A.; Ovsyannikov, D.
2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. 2014.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research
}
TY - GEN
T1 - Interface method of digital devices testing
AU - Grishkin, V.
AU - Yelaev, Y.
AU - Lopatkin, G.
AU - Mikhailov, A.
AU - Ovsyannikov, D.
PY - 2014
Y1 - 2014
N2 - © 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.
AB - © 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.
U2 - 10.1109/IVESC.2014.6891994
DO - 10.1109/IVESC.2014.6891994
M3 - Conference contribution
SN - 9781479957729
BT - 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings
ER -
ID: 7061702