Standard

Interface method of digital devices testing. / Grishkin, V.; Yelaev, Y.; Lopatkin, G.; Mikhailov, A.; Ovsyannikov, D.

2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. 2014.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research

Harvard

Grishkin, V, Yelaev, Y, Lopatkin, G, Mikhailov, A & Ovsyannikov, D 2014, Interface method of digital devices testing. in 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. https://doi.org/10.1109/IVESC.2014.6891994

APA

Grishkin, V., Yelaev, Y., Lopatkin, G., Mikhailov, A., & Ovsyannikov, D. (2014). Interface method of digital devices testing. In 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings https://doi.org/10.1109/IVESC.2014.6891994

Vancouver

Grishkin V, Yelaev Y, Lopatkin G, Mikhailov A, Ovsyannikov D. Interface method of digital devices testing. In 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. 2014 https://doi.org/10.1109/IVESC.2014.6891994

Author

Grishkin, V. ; Yelaev, Y. ; Lopatkin, G. ; Mikhailov, A. ; Ovsyannikov, D. / Interface method of digital devices testing. 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. 2014.

BibTeX

@inproceedings{6499c54e90c14f2784c42bf9f6876296,
title = "Interface method of digital devices testing",
abstract = "{\textcopyright} 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.",
author = "V. Grishkin and Y. Yelaev and G. Lopatkin and A. Mikhailov and D. Ovsyannikov",
year = "2014",
doi = "10.1109/IVESC.2014.6891994",
language = "English",
isbn = "9781479957729",
booktitle = "2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings",

}

RIS

TY - GEN

T1 - Interface method of digital devices testing

AU - Grishkin, V.

AU - Yelaev, Y.

AU - Lopatkin, G.

AU - Mikhailov, A.

AU - Ovsyannikov, D.

PY - 2014

Y1 - 2014

N2 - © 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.

AB - © 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.

U2 - 10.1109/IVESC.2014.6891994

DO - 10.1109/IVESC.2014.6891994

M3 - Conference contribution

SN - 9781479957729

BT - 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings

ER -

ID: 7061702