Interface method of digital devices testing

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research

Department of Computer Modelling and Multiprocessor Systems
Department of Control Systems Theory for Electrophysical Facilities

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https://doi.org/10.1109/IVESC.2014.6891994
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V. Grishkin
Y. Yelaev
G. Lopatkin
A. Mikhailov
D. Ovsyannikov

Original language	English
Title of host publication	2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings
DOIs	https://doi.org/10.1109/IVESC.2014.6891994
State	Published - 2014

ID: 7061702

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Interface method of digital devices testing

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