Standard

Interface method of digital devices testing. / Grishkin, V.; Yelaev, Y.; Lopatkin, G.; Mikhailov, A.; Ovsyannikov, D.

2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. 2014.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная

Harvard

Grishkin, V, Yelaev, Y, Lopatkin, G, Mikhailov, A & Ovsyannikov, D 2014, Interface method of digital devices testing. в 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. https://doi.org/10.1109/IVESC.2014.6891994

APA

Grishkin, V., Yelaev, Y., Lopatkin, G., Mikhailov, A., & Ovsyannikov, D. (2014). Interface method of digital devices testing. в 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings https://doi.org/10.1109/IVESC.2014.6891994

Vancouver

Grishkin V, Yelaev Y, Lopatkin G, Mikhailov A, Ovsyannikov D. Interface method of digital devices testing. в 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. 2014 https://doi.org/10.1109/IVESC.2014.6891994

Author

Grishkin, V. ; Yelaev, Y. ; Lopatkin, G. ; Mikhailov, A. ; Ovsyannikov, D. / Interface method of digital devices testing. 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings. 2014.

BibTeX

@inproceedings{6499c54e90c14f2784c42bf9f6876296,
title = "Interface method of digital devices testing",
abstract = "{\textcopyright} 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.",
author = "V. Grishkin and Y. Yelaev and G. Lopatkin and A. Mikhailov and D. Ovsyannikov",
year = "2014",
doi = "10.1109/IVESC.2014.6891994",
language = "English",
isbn = "9781479957729",
booktitle = "2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings",

}

RIS

TY - GEN

T1 - Interface method of digital devices testing

AU - Grishkin, V.

AU - Yelaev, Y.

AU - Lopatkin, G.

AU - Mikhailov, A.

AU - Ovsyannikov, D.

PY - 2014

Y1 - 2014

N2 - © 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.

AB - © 2014 IEEE. The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.

U2 - 10.1109/IVESC.2014.6891994

DO - 10.1109/IVESC.2014.6891994

M3 - Conference contribution

SN - 9781479957729

BT - 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings

ER -

ID: 7061702