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  1. 2009

  2. СВЕТОИНДУЦИРОВАННАЯ НЕКОВАЛЕНТНАЯ ФИКСАЦИЯ ДНК И СИНТЕТИЧЕСКИХ ПОЛИИОНОВ НА ПОВЕРХНОСТИ МОНОКРИСТАЛЛОВ КРЕМНИЯ LIGHT-INDUCED NONCOVALENT FIXATION OF DNA AND SYNTHETIC POLYIONS ON THE SURFACE OF SILICON SINGLE CRYSTALS

    Волков, И. Л., Базлов, Н. В., Бондаренко, А. С., Вывенко, О. Ф. & Касьяненко, Н. А., 2009, In: ЖУРНАЛ СТРУКТУРНОЙ ХИМИИ. 5, p. 999-1006

    Research output: Contribution to journal › Article › peer-review

  3. 2007

  4. Search for resonant absorption of solar axions emitted in an M1 transition in 57Fe nuclei

    Derbin, A. V., Egorov, A. I., Mitropol'Sky, I. A., Muratova, V. N., Bazlov, N. V., Bakhlanov, S. V., Semenov, D. A. & Unzhakov, E. V., 1 Jan 2007, In: JETP Letters. 85, 1, p. 12-16 5 p.

    Research output: Contribution to journal › Article › peer-review

  5. 2005

  6. Impact of hydrogenation on electrical properties of NiSi2 precipitates in silicon

    Vyvenko, O. F., Bazlov, N. V., Trushin, M. V., Nadolinski, A. A., Seibt, M., Schröter, W. & Hahn, G., 2005, Gettering and Defect Engineering in Semiconductor Technology XI, Gadest 2005 - Proceedings of the 11th International Autumn Meeting. Trans Tech Publications Ltd, p. 279-284 6 p. (Solid State Phenomena; vol. 108-109).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  7. 1987

  8. UNIVERSAL CAPACITIVE SPECTROMETER FOR MEASURING THE PARAMETERS OF DEEP CENTERS IN SEMICONDUCTORS AND MOS STRUCTURES.

    Bazlov, N. V., Vyvenko, O. F. & Tul'ev, A. V., May 1987, In: Instruments and experimental techniques New York. 30, 3 pt 2, p. 696-701 6 p.

    Research output: Contribution to journal › Article › peer-review

  9. 1986

  10. DEEP LEVELS DUE TO DISLOCATIONS IN CdS.

    Vyvenko, O. F., Bazlov, N. V. & Tul'ev, A. V., 1986, In: Bulletin of the Academy of Sciences of the U.S.S.R. Physical series. 51, 4, p. 39-43 5 p.

    Research output: Contribution to journal › Conference article › peer-review

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ID: 147004