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Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation. / Petrov, Yu; Vyvenko, O.

в: Microscopy and Microanalysis, Том 18, № S2, 01.01.2012, стр. 824-825.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Petrov, Y & Vyvenko, O 2012, 'Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation', Microscopy and Microanalysis, Том. 18, № S2, стр. 824-825. https://doi.org/10.1017/S1431927612005971

APA

Petrov, Y., & Vyvenko, O. (2012). Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation. Microscopy and Microanalysis, 18(S2), 824-825. https://doi.org/10.1017/S1431927612005971

Vancouver

Petrov Y, Vyvenko O. Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation. Microscopy and Microanalysis. 2012 Янв. 1;18(S2):824-825. https://doi.org/10.1017/S1431927612005971

Author

Petrov, Yu ; Vyvenko, O. / Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation. в: Microscopy and Microanalysis. 2012 ; Том 18, № S2. стр. 824-825.

BibTeX

@article{8a04a816942944008c70fe42408aa2b4,
title = "Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation",
abstract = "Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.",
author = "Yu Petrov and O. Vyvenko",
year = "2012",
month = jan,
day = "1",
doi = "10.1017/S1431927612005971",
language = "English",
volume = "18",
pages = "824--825",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "S2",

}

RIS

TY - JOUR

T1 - Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation

AU - Petrov, Yu

AU - Vyvenko, O.

PY - 2012/1/1

Y1 - 2012/1/1

N2 - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

AB - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

UR - http://www.scopus.com/inward/record.url?scp=85011484635&partnerID=8YFLogxK

U2 - 10.1017/S1431927612005971

DO - 10.1017/S1431927612005971

M3 - Article

AN - SCOPUS:85011484635

VL - 18

SP - 824

EP - 825

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S2

ER -

ID: 35937124