Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. / Kanygin, M. A.; Okotrub, A. V.; Bulusheva, L. G.; Vilkov, O. Y.; Hata, K.
в: Current Applied Physics, Том 15, № 10, 2015, стр. 1111-1116.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy
AU - Kanygin, M. A.
AU - Okotrub, A. V.
AU - Bulusheva, L. G.
AU - Vilkov, O. Y.
AU - Hata, K.
PY - 2015
Y1 - 2015
N2 - Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.
AB - Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.
KW - Angle-resolved NEXAFS
KW - Single-walled carbon nanotubes
KW - Wall distortion
KW - X-ray fluorescent spectroscopy
UR - http://www.scopus.com/inward/record.url?scp=84940725938&partnerID=8YFLogxK
U2 - 10.1016/j.cap.2015.06.017
DO - 10.1016/j.cap.2015.06.017
M3 - Article
AN - SCOPUS:84940725938
VL - 15
SP - 1111
EP - 1116
JO - Current Applied Physics
JF - Current Applied Physics
SN - 1567-1739
IS - 10
ER -
ID: 9290758