Standard

Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. / Kanygin, M. A.; Okotrub, A. V.; Bulusheva, L. G.; Vilkov, O. Y.; Hata, K.

In: Current Applied Physics, Vol. 15, No. 10, 2015, p. 1111-1116.

Research output: Contribution to journal › Article › peer-review

Harvard

Kanygin, MA, Okotrub, AV, Bulusheva, LG, Vilkov, OY & Hata, K 2015, 'Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy', Current Applied Physics, vol. 15, no. 10, pp. 1111-1116. https://doi.org/10.1016/j.cap.2015.06.017

APA

Kanygin, M. A., Okotrub, A. V., Bulusheva, L. G., Vilkov, O. Y., & Hata, K. (2015). Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. Current Applied Physics, 15(10), 1111-1116. https://doi.org/10.1016/j.cap.2015.06.017

Vancouver

Kanygin MA, Okotrub AV, Bulusheva LG, Vilkov OY, Hata K. Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. Current Applied Physics. 2015;15(10):1111-1116. https://doi.org/10.1016/j.cap.2015.06.017

Author

Kanygin, M. A. ; Okotrub, A. V. ; Bulusheva, L. G. ; Vilkov, O. Y. ; Hata, K. / Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy. In: Current Applied Physics. 2015 ; Vol. 15, No. 10. pp. 1111-1116.

BibTeX

@article{c3948e3a6a3544fab5c27f921ce546a2,
title = "Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy",
abstract = "Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.",
keywords = "Angle-resolved NEXAFS, Single-walled carbon nanotubes, Wall distortion, X-ray fluorescent spectroscopy",
author = "Kanygin, {M. A.} and Okotrub, {A. V.} and Bulusheva, {L. G.} and Vilkov, {O. Y.} and K. Hata",
year = "2015",
doi = "10.1016/j.cap.2015.06.017",
language = "English",
volume = "15",
pages = "1111--1116",
journal = "Current Applied Physics",
issn = "1567-1739",
publisher = "Elsevier",
number = "10",

}

RIS

TY - JOUR

T1 - Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy

AU - Kanygin, M. A.

AU - Okotrub, A. V.

AU - Bulusheva, L. G.

AU - Vilkov, O. Y.

AU - Hata, K.

PY - 2015

Y1 - 2015

N2 - Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.

AB - Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13° and 23-27°, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24°) of SWCNT walls could be related to the defects introduced during the growth process.

KW - Angle-resolved NEXAFS

KW - Single-walled carbon nanotubes

KW - Wall distortion

KW - X-ray fluorescent spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=84940725938&partnerID=8YFLogxK

U2 - 10.1016/j.cap.2015.06.017

DO - 10.1016/j.cap.2015.06.017

M3 - Article

AN - SCOPUS:84940725938

VL - 15

SP - 1111

EP - 1116

JO - Current Applied Physics

JF - Current Applied Physics

SN - 1567-1739

IS - 10

ER -

ID: 9290758