Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
The technique of the determination of surface conditions of dielectric and semiconductor materials is described. The basis of this technique is dielectric spectrometry. An effective technique of the rapid analysis of the information about surface conditions has been proposed. This technique is based on the iteration Fourier analysis in the real time scale. The algorithm for the calculation of basic parameters of the surface under investigation has been described.
Язык оригинала | английский |
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Страницы (с-по) | 1485-1495 |
Число страниц | 11 |
Журнал | Surface Investigation X-Ray, Synchrotron and Neutron Techniques |
Том | 15 |
Номер выпуска | 10 |
Состояние | Опубликовано - 1 дек 2000 |
ID: 52377517