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Evaluation of the quality of the dielectric spectroscopy data. / Karpov, Andrey G.; Klemeshev, Vladimir A.

2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. стр. 57-59 7886537.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование

Harvard

Karpov, AG & Klemeshev, VA 2017, Evaluation of the quality of the dielectric spectroscopy data. в 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings., 7886537, Institute of Electrical and Electronics Engineers Inc., стр. 57-59, 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016, St. Petersburg, Российская Федерация, 1/10/16. https://doi.org/10.1109/BALD.2016.7886537

APA

Karpov, A. G., & Klemeshev, V. A. (2017). Evaluation of the quality of the dielectric spectroscopy data. в 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings (стр. 57-59). [7886537] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/BALD.2016.7886537

Vancouver

Karpov AG, Klemeshev VA. Evaluation of the quality of the dielectric spectroscopy data. в 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. стр. 57-59. 7886537 https://doi.org/10.1109/BALD.2016.7886537

Author

Karpov, Andrey G. ; Klemeshev, Vladimir A. / Evaluation of the quality of the dielectric spectroscopy data. 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. стр. 57-59

BibTeX

@inproceedings{a422112bb055454a86ea461f4663333f,
title = "Evaluation of the quality of the dielectric spectroscopy data",
abstract = "The dielectric spectroscopy data contains information on both the structure and internal bonds of the material and its functional properties. Due to the principles of dielectric spectroscopy, such measurements require rather complex processing algorithms.",
author = "Karpov, {Andrey G.} and Klemeshev, {Vladimir A.}",
year = "2017",
month = mar,
day = "24",
doi = "10.1109/BALD.2016.7886537",
language = "English",
pages = "57--59",
booktitle = "2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 ; Conference date: 01-10-2016 Through 03-10-2016",

}

RIS

TY - GEN

T1 - Evaluation of the quality of the dielectric spectroscopy data

AU - Karpov, Andrey G.

AU - Klemeshev, Vladimir A.

PY - 2017/3/24

Y1 - 2017/3/24

N2 - The dielectric spectroscopy data contains information on both the structure and internal bonds of the material and its functional properties. Due to the principles of dielectric spectroscopy, such measurements require rather complex processing algorithms.

AB - The dielectric spectroscopy data contains information on both the structure and internal bonds of the material and its functional properties. Due to the principles of dielectric spectroscopy, such measurements require rather complex processing algorithms.

UR - http://www.scopus.com/inward/record.url?scp=85017615594&partnerID=8YFLogxK

U2 - 10.1109/BALD.2016.7886537

DO - 10.1109/BALD.2016.7886537

M3 - Conference contribution

AN - SCOPUS:85017615594

SP - 57

EP - 59

BT - 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016

Y2 - 1 October 2016 through 3 October 2016

ER -

ID: 9294084