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Double ground fault resistance. / Mugu, Artur I.

Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering. 2023. стр. 941-943.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование

Harvard

Mugu, AI 2023, Double ground fault resistance. в Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering. стр. 941-943, 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2023, St. Petersburg, Российская Федерация, 24/01/23.

APA

Mugu, A. I. (2023). Double ground fault resistance. в Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering (стр. 941-943)

Vancouver

Mugu AI. Double ground fault resistance. в Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering. 2023. стр. 941-943

Author

Mugu, Artur I. / Double ground fault resistance. Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering. 2023. стр. 941-943

BibTeX

@inproceedings{11d17cba60994a778aeff6de45805b5e,
title = "Double ground fault resistance",
author = "Mugu, {Artur I.}",
year = "2023",
language = "English",
pages = "941--943",
booktitle = "Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering",
note = "null ; Conference date: 24-01-2023 Through 27-01-2023",
url = "https://etu.ru/en/university/conferences/elconrus-2023",

}

RIS

TY - GEN

T1 - Double ground fault resistance

AU - Mugu, Artur I.

PY - 2023

Y1 - 2023

M3 - Conference contribution

SP - 941

EP - 943

BT - Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering

Y2 - 24 January 2023 through 27 January 2023

ER -

ID: 102528181