Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Double ground fault resistance. / Mugu, Artur I.
Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering. 2023. p. 941-943.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Double ground fault resistance
AU - Mugu, Artur I.
PY - 2023
Y1 - 2023
M3 - Conference contribution
SP - 941
EP - 943
BT - Proceedings of the 2023 Conference of Russian Young Researchers in Electrical and Electronic Engineering
Y2 - 24 January 2023 through 27 January 2023
ER -
ID: 102528181