Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots. / Punegov, V. I.; Sivkov, D. V.; Klad'ko, V. P.
в: Technical Physics Letters, Том 37, № 4, 01.04.2011, стр. 364-367.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots
AU - Punegov, V. I.
AU - Sivkov, D. V.
AU - Klad'ko, V. P.
PY - 2011/4/1
Y1 - 2011/4/1
N2 - A theory of diffuse X-ray scattering from a semiconductor system with ellipsoidal quantum dots (QDs) has been developed. The elastic strains outside a QD are calculated using the method of multipole expansions. An expression for the lattice displacement field is presented accurate to within the quadrupole term of expansion. Using the proposed approach, an analytical solution for the diffuse scattering from a crystalline medium with ellipsoidal inclusions is obtained. Reciprocal-space maps of the scattering intensity distribution are obtained by numerical calculations for QDs with various ratios of the height to lateral radius.
AB - A theory of diffuse X-ray scattering from a semiconductor system with ellipsoidal quantum dots (QDs) has been developed. The elastic strains outside a QD are calculated using the method of multipole expansions. An expression for the lattice displacement field is presented accurate to within the quadrupole term of expansion. Using the proposed approach, an analytical solution for the diffuse scattering from a crystalline medium with ellipsoidal inclusions is obtained. Reciprocal-space maps of the scattering intensity distribution are obtained by numerical calculations for QDs with various ratios of the height to lateral radius.
UR - http://www.scopus.com/inward/record.url?scp=79956161673&partnerID=8YFLogxK
U2 - 10.1134/S1063785011040262
DO - 10.1134/S1063785011040262
M3 - Article
AN - SCOPUS:79956161673
VL - 37
SP - 364
EP - 367
JO - Technical Physics Letters
JF - Technical Physics Letters
SN - 1063-7850
IS - 4
ER -
ID: 43104734