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Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots. / Punegov, V. I.; Sivkov, D. V.; Klad'ko, V. P.

In: Technical Physics Letters, Vol. 37, No. 4, 01.04.2011, p. 364-367.

Research output: Contribution to journal › Article › peer-review

Harvard

Punegov, VI, Sivkov, DV & Klad'ko, VP 2011, 'Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots', Technical Physics Letters, vol. 37, no. 4, pp. 364-367. https://doi.org/10.1134/S1063785011040262

APA

Punegov, V. I., Sivkov, D. V., & Klad'ko, V. P. (2011). Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots. Technical Physics Letters, 37(4), 364-367. https://doi.org/10.1134/S1063785011040262

Vancouver

Punegov VI, Sivkov DV, Klad'ko VP. Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots. Technical Physics Letters. 2011 Apr 1;37(4):364-367. https://doi.org/10.1134/S1063785011040262

Author

Punegov, V. I. ; Sivkov, D. V. ; Klad'ko, V. P. / Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots. In: Technical Physics Letters. 2011 ; Vol. 37, No. 4. pp. 364-367.

BibTeX

@article{9815091b36644ed9a561aa0f9a1dbe2a,
title = "Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots",
abstract = "A theory of diffuse X-ray scattering from a semiconductor system with ellipsoidal quantum dots (QDs) has been developed. The elastic strains outside a QD are calculated using the method of multipole expansions. An expression for the lattice displacement field is presented accurate to within the quadrupole term of expansion. Using the proposed approach, an analytical solution for the diffuse scattering from a crystalline medium with ellipsoidal inclusions is obtained. Reciprocal-space maps of the scattering intensity distribution are obtained by numerical calculations for QDs with various ratios of the height to lateral radius.",
author = "Punegov, {V. I.} and Sivkov, {D. V.} and Klad'ko, {V. P.}",
year = "2011",
month = apr,
day = "1",
doi = "10.1134/S1063785011040262",
language = "English",
volume = "37",
pages = "364--367",
journal = "Technical Physics Letters",
issn = "1063-7850",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "4",

}

RIS

TY - JOUR

T1 - Diffuse X-Ray scattering from crystalline systems with ellipsoidal quantum dots

AU - Punegov, V. I.

AU - Sivkov, D. V.

AU - Klad'ko, V. P.

PY - 2011/4/1

Y1 - 2011/4/1

N2 - A theory of diffuse X-ray scattering from a semiconductor system with ellipsoidal quantum dots (QDs) has been developed. The elastic strains outside a QD are calculated using the method of multipole expansions. An expression for the lattice displacement field is presented accurate to within the quadrupole term of expansion. Using the proposed approach, an analytical solution for the diffuse scattering from a crystalline medium with ellipsoidal inclusions is obtained. Reciprocal-space maps of the scattering intensity distribution are obtained by numerical calculations for QDs with various ratios of the height to lateral radius.

AB - A theory of diffuse X-ray scattering from a semiconductor system with ellipsoidal quantum dots (QDs) has been developed. The elastic strains outside a QD are calculated using the method of multipole expansions. An expression for the lattice displacement field is presented accurate to within the quadrupole term of expansion. Using the proposed approach, an analytical solution for the diffuse scattering from a crystalline medium with ellipsoidal inclusions is obtained. Reciprocal-space maps of the scattering intensity distribution are obtained by numerical calculations for QDs with various ratios of the height to lateral radius.

UR - http://www.scopus.com/inward/record.url?scp=79956161673&partnerID=8YFLogxK

U2 - 10.1134/S1063785011040262

DO - 10.1134/S1063785011040262

M3 - Article

AN - SCOPUS:79956161673

VL - 37

SP - 364

EP - 367

JO - Technical Physics Letters

JF - Technical Physics Letters

SN - 1063-7850

IS - 4

ER -

ID: 43104734