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DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD. / Bertsev, V.V.; Bureiko, S.F.; Karklit, A.Yu.; Pastor, A.A.; Serdobintsev, P.Yu.

в: Optics and Spectroscopy (English translation of Optika i Spektroskopiya), № 6, 1999, стр. 830-832.

Результаты исследований: Научные публикации в периодических изданияхстатья

Harvard

Bertsev, VV, Bureiko, SF, Karklit, AY, Pastor, AA & Serdobintsev, PY 1999, 'DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD', Optics and Spectroscopy (English translation of Optika i Spektroskopiya), № 6, стр. 830-832. <http://elibrary.ru/item.asp?id=11863477>

APA

Bertsev, V. V., Bureiko, S. F., Karklit, A. Y., Pastor, A. A., & Serdobintsev, P. Y. (1999). DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD. Optics and Spectroscopy (English translation of Optika i Spektroskopiya), (6), 830-832. http://elibrary.ru/item.asp?id=11863477

Vancouver

Bertsev VV, Bureiko SF, Karklit AY, Pastor AA, Serdobintsev PY. DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD. Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 1999;(6):830-832.

Author

Bertsev, V.V. ; Bureiko, S.F. ; Karklit, A.Yu. ; Pastor, A.A. ; Serdobintsev, P.Yu. / DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD. в: Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 1999 ; № 6. стр. 830-832.

BibTeX

@article{d1517d66894941d8b3ca3c8af2e498a5,
title = "DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD",
abstract = "Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 ? 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.",
author = "V.V. Bertsev and S.F. Bureiko and A.Yu. Karklit and A.A. Pastor and P.Yu. Serdobintsev",
year = "1999",
language = "English",
pages = "830--832",
journal = "OPTICS AND SPECTROSCOPY",
issn = "0030-400X",
publisher = "Pleiades Publishing",
number = "6",

}

RIS

TY - JOUR

T1 - DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD

AU - Bertsev, V.V.

AU - Bureiko, S.F.

AU - Karklit, A.Yu.

AU - Pastor, A.A.

AU - Serdobintsev, P.Yu.

PY - 1999

Y1 - 1999

N2 - Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 ? 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.

AB - Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 ? 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.

M3 - Article

SP - 830

EP - 832

JO - OPTICS AND SPECTROSCOPY

JF - OPTICS AND SPECTROSCOPY

SN - 0030-400X

IS - 6

ER -

ID: 5029515