DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD. / Bertsev, V.V.; Bureiko, S.F.; Karklit, A.Yu.; Pastor, A.A.; Serdobintsev, P.Yu.
In: Optics and Spectroscopy (English translation of Optika i Spektroskopiya), No. 6, 1999, p. 830-832.Research output: Contribution to journal › Article
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TY - JOUR
T1 - DETERMINATION OF THE NONLINEAR CONTRIBUTION TO REFRACTION OF COMPRESSED XENON AT 308 NM BY THE SELF-DIFFRACTION METHOD
AU - Bertsev, V.V.
AU - Bureiko, S.F.
AU - Karklit, A.Yu.
AU - Pastor, A.A.
AU - Serdobintsev, P.Yu.
PY - 1999
Y1 - 1999
N2 - Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 ? 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.
AB - Parameters of a diffraction pattern obtained through diffraction of a probe beam of laser radiation by a phase inhomogeneity formed by radiation of a XeCl laser focused into a cell with compressed xenon were measured. The nonlinear addition to the refractive index was found to have the value n2 = 4.7 ? 10-12 cm2/W. Plausible mechanisms of nonlinearity are discussed.
M3 - Article
SP - 830
EP - 832
JO - OPTICS AND SPECTROSCOPY
JF - OPTICS AND SPECTROSCOPY
SN - 0030-400X
IS - 6
ER -
ID: 5029515