DOI

It has been generally accepted that any reaction between micropipes in silicon carbide (SiC) crystals requires a direct contact of the micropipes. We propose a new model of contact-free reactions that are realized through the emission and absorption of full-core dislocations by micropipes. This model can explain the correlated reduction in micropipe radii in the samples with low micropipe densities which has been observed in synchrotron radiation (SR) phase contrast images supported by computer simulations. We provide a theoretical description of a contact-free reaction between two parallel micropipes.

Язык оригиналаанглийский
Страницы (с-по)1432-1437
Число страниц6
ЖурналPhysica Status Solidi (A) Applications and Materials Science
Том209
Номер выпуска8
DOI
СостояниеОпубликовано - авг 2012
Опубликовано для внешнего пользованияДа

    Предметные области Scopus

  • Электроника, оптика и магнитные материалы
  • Физика конденсатов
  • Поверхности и интерфейсы
  • Поверхности, слои и пленки
  • Электротехника и электроника
  • Химия материалов

ID: 97786858