DOI

It has been generally accepted that any reaction between micropipes in silicon carbide (SiC) crystals requires a direct contact of the micropipes. We propose a new model of contact-free reactions that are realized through the emission and absorption of full-core dislocations by micropipes. This model can explain the correlated reduction in micropipe radii in the samples with low micropipe densities which has been observed in synchrotron radiation (SR) phase contrast images supported by computer simulations. We provide a theoretical description of a contact-free reaction between two parallel micropipes.

Original languageEnglish
Pages (from-to)1432-1437
Number of pages6
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume209
Issue number8
DOIs
StatePublished - Aug 2012
Externally publishedYes

    Research areas

  • crystal structure, defects, single crystal growth, synchrotron X-ray diffraction

    Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

ID: 97786858