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Basic principles. / Egorov, Nikolay; Sheshin, Evgeny.

Springer Series in Advanced Microelectronics. Springer Nature, 2017. (Springer Series in Advanced Microelectronics; Том 60).

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › глава/раздел › научная › Рецензирование

Harvard

Egorov, N & Sheshin, E 2017, Basic principles. в Springer Series in Advanced Microelectronics. Springer Series in Advanced Microelectronics, Том. 60, Springer Nature. https://doi.org/10.1007/978-3-319-56561-3_1

APA

Egorov, N., & Sheshin, E. (2017). Basic principles. в Springer Series in Advanced Microelectronics (Springer Series in Advanced Microelectronics; Том 60). Springer Nature. https://doi.org/10.1007/978-3-319-56561-3_1

Vancouver

Egorov N, Sheshin E. Basic principles. в Springer Series in Advanced Microelectronics. Springer Nature. 2017. (Springer Series in Advanced Microelectronics). https://doi.org/10.1007/978-3-319-56561-3_1

Author

Egorov, Nikolay ; Sheshin, Evgeny. / Basic principles. Springer Series in Advanced Microelectronics. Springer Nature, 2017. (Springer Series in Advanced Microelectronics).

BibTeX

@inbook{a423b443aaac41f9a08d93d0310e75a0,
title = "Basic principles",
abstract = "This chapter describes the basic principles of Fowler–Nordheim theory of field emission from metals and classical Morgulis-Stratton theory of field emission from semiconductors. Then it discusses the theoretical basics of M{\"u}ller field emission microscope as the first experimental device which allowed to test the main conclusions of the classical theory of field electron emission. Disadvantages of these classical theories and limits to their applicability are discussed.",
author = "Nikolay Egorov and Evgeny Sheshin",
year = "2017",
month = jan,
day = "1",
doi = "10.1007/978-3-319-56561-3_1",
language = "English",
series = "Springer Series in Advanced Microelectronics",
publisher = "Springer Nature",
booktitle = "Springer Series in Advanced Microelectronics",
address = "Germany",

}

RIS

TY - CHAP

T1 - Basic principles

AU - Egorov, Nikolay

AU - Sheshin, Evgeny

PY - 2017/1/1

Y1 - 2017/1/1

N2 - This chapter describes the basic principles of Fowler–Nordheim theory of field emission from metals and classical Morgulis-Stratton theory of field emission from semiconductors. Then it discusses the theoretical basics of Müller field emission microscope as the first experimental device which allowed to test the main conclusions of the classical theory of field electron emission. Disadvantages of these classical theories and limits to their applicability are discussed.

AB - This chapter describes the basic principles of Fowler–Nordheim theory of field emission from metals and classical Morgulis-Stratton theory of field emission from semiconductors. Then it discusses the theoretical basics of Müller field emission microscope as the first experimental device which allowed to test the main conclusions of the classical theory of field electron emission. Disadvantages of these classical theories and limits to their applicability are discussed.

UR - http://www.scopus.com/inward/record.url?scp=85020174547&partnerID=8YFLogxK

U2 - 10.1007/978-3-319-56561-3_1

DO - 10.1007/978-3-319-56561-3_1

M3 - Chapter

AN - SCOPUS:85020174547

T3 - Springer Series in Advanced Microelectronics

BT - Springer Series in Advanced Microelectronics

PB - Springer Nature

ER -

ID: 49549629