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This chapter describes the basic principles of Fowler–Nordheim theory of field emission from metals and classical Morgulis-Stratton theory of field emission from semiconductors. Then it discusses the theoretical basics of Müller field emission microscope as the first experimental device which allowed to test the main conclusions of the classical theory of field electron emission. Disadvantages of these classical theories and limits to their applicability are discussed.
Язык оригинала | английский |
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Название основной публикации | Springer Series in Advanced Microelectronics |
Издатель | Springer Nature |
DOI | |
Состояние | Опубликовано - 1 янв 2017 |
Название | Springer Series in Advanced Microelectronics |
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Том | 60 |
ISSN (печатное издание) | 1437-0387 |
ID: 49549629