DOI

This chapter describes the basic principles of Fowler–Nordheim theory of field emission from metals and classical Morgulis-Stratton theory of field emission from semiconductors. Then it discusses the theoretical basics of Müller field emission microscope as the first experimental device which allowed to test the main conclusions of the classical theory of field electron emission. Disadvantages of these classical theories and limits to their applicability are discussed.

Язык оригиналаанглийский
Название основной публикацииSpringer Series in Advanced Microelectronics
ИздательSpringer Nature
DOI
СостояниеОпубликовано - 1 янв 2017

Серия публикаций

НазваниеSpringer Series in Advanced Microelectronics
Том60
ISSN (печатное издание)1437-0387

    Предметные области Scopus

  • Электротехника и электроника

ID: 49549629