X-Ray Spectroscopic Methods for Thin Films and Interfaces Study

Physics of X-ray and Neutron Multilayer Structures, Palaiseau, France, November 7 – 9, 2018. 2018. p. 27.

Research output: Chapter in Book/Report/Conference proceeding › Conference abstracts › peer-review

Filatova, E , Konashuk, AS & Sakhonenkov, SS 2018, X-Ray Spectroscopic Methods for Thin Films and Interfaces Study. in Physics of X-ray and Neutron Multilayer Structures, Palaiseau, France, November 7 – 9, 2018. pp. 27, Physics of X-Ray and Neutron Multilayer Structures, Palaiseau, France, 7/11/18.

Filatova, E., Konashuk, A. S., & Sakhonenkov, S. S. (2018). X-Ray Spectroscopic Methods for Thin Films and Interfaces Study. In Physics of X-ray and Neutron Multilayer Structures, Palaiseau, France, November 7 – 9, 2018 (pp. 27)

Filatova E , Konashuk AS , Sakhonenkov SS. X-Ray Spectroscopic Methods for Thin Films and Interfaces Study. In Physics of X-ray and Neutron Multilayer Structures, Palaiseau, France, November 7 – 9, 2018. 2018. p. 27

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title = "X-Ray Spectroscopic Methods for Thin Films and Interfaces Study",

author = "Elena Filatova and Konashuk, {Aleksei S.} and Sakhonenkov, {Sergei S.}",

year = "2018",

language = "English",

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T1 - X-Ray Spectroscopic Methods for Thin Films and Interfaces Study

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AU - Konashuk, Aleksei S.

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BT - Physics of X-ray and Neutron Multilayer Structures, Palaiseau, France, November 7 – 9, 2018

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