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Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon. / Seifert, W.; Vyvenko, O.F.; Arguirov, T.; Erko, A.; Kittler, M.; Rudolf, C.; Salome, M.; Trushin, M.; Zizak, I.

In: Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 6, No. 3, 2009, p. 765-771.

Research output: Contribution to journal › Article

Harvard

Seifert, W, Vyvenko, OF, Arguirov, T, Erko, A, Kittler, M, Rudolf, C, Salome, M, Trushin, M & Zizak, I 2009, 'Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon', Physica Status Solidi (C) Current Topics in Solid State Physics, vol. 6, no. 3, pp. 765-771. https://doi.org/10.1002/pssc.200880717

APA

Seifert, W., Vyvenko, O. F., Arguirov, T., Erko, A., Kittler, M., Rudolf, C., Salome, M., Trushin, M., & Zizak, I. (2009). Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon. Physica Status Solidi (C) Current Topics in Solid State Physics, 6(3), 765-771. https://doi.org/10.1002/pssc.200880717

Vancouver

Seifert W, Vyvenko OF, Arguirov T, Erko A, Kittler M, Rudolf C et al. Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon. Physica Status Solidi (C) Current Topics in Solid State Physics. 2009;6(3):765-771. https://doi.org/10.1002/pssc.200880717

Author

Seifert, W. ; Vyvenko, O.F. ; Arguirov, T. ; Erko, A. ; Kittler, M. ; Rudolf, C. ; Salome, M. ; Trushin, M. ; Zizak, I. / Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon. In: Physica Status Solidi (C) Current Topics in Solid State Physics. 2009 ; Vol. 6, No. 3. pp. 765-771.

BibTeX

@article{bf18fd975d8747e8ac10eeb88b591bb0,
title = "Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon",
author = "W. Seifert and O.F. Vyvenko and T. Arguirov and A. Erko and M. Kittler and C. Rudolf and M. Salome and M. Trushin and I. Zizak",
year = "2009",
doi = "10.1002/pssc.200880717",
language = "English",
volume = "6",
pages = "765--771",
journal = "Physica Status Solidi C: Conferences",
issn = "1862-6351",
publisher = "Wiley-Blackwell",
number = "3",

}

RIS

TY - JOUR

T1 - Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon

AU - Seifert, W.

AU - Vyvenko, O.F.

AU - Arguirov, T.

AU - Erko, A.

AU - Kittler, M.

AU - Rudolf, C.

AU - Salome, M.

AU - Trushin, M.

AU - Zizak, I.

PY - 2009

Y1 - 2009

U2 - 10.1002/pssc.200880717

DO - 10.1002/pssc.200880717

M3 - Article

VL - 6

SP - 765

EP - 771

JO - Physica Status Solidi C: Conferences

JF - Physica Status Solidi C: Conferences

SN - 1862-6351

IS - 3

ER -

ID: 5477130