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Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon
Research output
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Contribution to journal
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Article
Department of Solid State Electronics
Overview
Cite this
DOI
https://doi.org/10.1002/pssc.200880717
Other version
W. Seifert
O.F. Vyvenko
T. Arguirov
A. Erko
M. Kittler
C. Rudolf
M. Salome
M. Trushin
I. Zizak
Original language
English
Pages (from-to)
765-771
Journal
Physica Status Solidi (C) Current Topics in Solid State Physics
Volume
6
Issue number
3
DOIs
https://doi.org/10.1002/pssc.200880717
State
Published -
2009
ID: 5477130