Stress analysis of bi-material plane with an elliptic hole by analytical and numerical methods

Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc., 2016. p. 1-6.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research

Malkova, Y & Petrukhin, R 2016, Stress analysis of bi-material plane with an elliptic hole by analytical and numerical methods. in Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc., pp. 1-6, 2016 Young Researchers in Vacuum Micro/Nano Electronics, VMNE-YR 2016, Saint-Petersburg, Russian Federation, 4/10/16. https://doi.org/10.1109/VMNEYR.2016.7880409

Malkova, Y., & Petrukhin, R. (2016). Stress analysis of bi-material plane with an elliptic hole by analytical and numerical methods. In Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR) (pp. 1-6). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VMNEYR.2016.7880409

Malkova Y, Petrukhin R. Stress analysis of bi-material plane with an elliptic hole by analytical and numerical methods. In Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc. 2016. p. 1-6 https://doi.org/10.1109/VMNEYR.2016.7880409

Malkova, Yulia ; Petrukhin, Ruslan. / Stress analysis of bi-material plane with an elliptic hole by analytical and numerical methods. Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc., 2016. pp. 1-6

@inproceedings{c68a6d9ff10741a08d854a9d3f4ef209,

title = "Stress analysis of bi-material plane with an elliptic hole by analytical and numerical methods",

author = "Yulia Malkova and Ruslan Petrukhin",

year = "2016",

doi = "10.1109/VMNEYR.2016.7880409",

language = "English",

pages = "1--6",

booktitle = "Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR)",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "2016 Young Researchers in Vacuum Micro/Nano Electronics, VMNE-YR 2016 ; Conference date: 04-10-2016 Through 05-10-2016",

}

TY - GEN

T1 - Stress analysis of bi-material plane with an elliptic hole by analytical and numerical methods

AU - Malkova, Yulia

AU - Petrukhin, Ruslan

PY - 2016

Y1 - 2016

U2 - 10.1109/VMNEYR.2016.7880409

DO - 10.1109/VMNEYR.2016.7880409

M3 - Conference contribution

SP - 1

EP - 6

BT - Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR)

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2016 Young Researchers in Vacuum Micro/Nano Electronics, VMNE-YR 2016

Y2 - 4 October 2016 through 5 October 2016

ER -

ID: 7657967