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Scanning reflection ion microscopy in a helium ion microscope. / Petrov, Y.V.; Vyvenko, O.F.

In: Beilstein Journal of Nanotechnology, Vol. 6, 2015, p. 1125-1137.

Research output: Contribution to journal › Article

Harvard

Petrov, YV & Vyvenko, OF 2015, 'Scanning reflection ion microscopy in a helium ion microscope', Beilstein Journal of Nanotechnology, vol. 6, pp. 1125-1137. https://doi.org/10.3762/bjnano.6.114

APA

Petrov, Y. V., & Vyvenko, O. F. (2015). Scanning reflection ion microscopy in a helium ion microscope. Beilstein Journal of Nanotechnology, 6, 1125-1137. https://doi.org/10.3762/bjnano.6.114

Vancouver

Petrov YV, Vyvenko OF. Scanning reflection ion microscopy in a helium ion microscope. Beilstein Journal of Nanotechnology. 2015;6:1125-1137. https://doi.org/10.3762/bjnano.6.114

Author

Petrov, Y.V. ; Vyvenko, O.F. / Scanning reflection ion microscopy in a helium ion microscope. In: Beilstein Journal of Nanotechnology. 2015 ; Vol. 6. pp. 1125-1137.

BibTeX

@article{5b9ff766444f440695f4212c79ac89d1,
title = "Scanning reflection ion microscopy in a helium ion microscope",
author = "Y.V. Petrov and O.F. Vyvenko",
year = "2015",
doi = "10.3762/bjnano.6.114",
language = "English",
volume = "6",
pages = "1125--1137",
journal = "Beilstein Journal of Nanotechnology",
issn = "2190-4286",
publisher = "Beilstein-Institut Zur Forderung der Chemischen Wissenschaften",

}

RIS

TY - JOUR

T1 - Scanning reflection ion microscopy in a helium ion microscope

AU - Petrov, Y.V.

AU - Vyvenko, O.F.

PY - 2015

Y1 - 2015

U2 - 10.3762/bjnano.6.114

DO - 10.3762/bjnano.6.114

M3 - Article

VL - 6

SP - 1125

EP - 1137

JO - Beilstein Journal of Nanotechnology

JF - Beilstein Journal of Nanotechnology

SN - 2190-4286

ER -

ID: 3932674